DMCA

Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF (1999)

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by P. Suortti , T. Buslaps , P. Fajardo , V. Honkimäki , M. Kretzschmer , U. Lienert , J. E. McCarthy , M. Renier , A. Shukla , Th. Tschentscher , T. Meinander