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Reliability Mechanisms for Very Large Storage Systems (2003)  (Make Corrections)  (10 citations)
Qin Xin Ethan L. Miller Thomas Schwarz, S.J. ...



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Abstract: Reliability and availability are increasingly important in large-scale storage systems built from thousands of individual storage devices. Large systems must survive the failure of individual components; in systems with thousands of disks, even infrequent failures are likely in some device. We focus on two types of errors: nonrecoverable read errors and drive failures. We discuss mechanisms for detecting and recovering from such errors, introducing improved techniques for detecting errors in... (Update)

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BibTeX entry:   (Update)

Q. Xin, E. L. Miller, D. D. E. Long, S. A. Brandt, T. Schwarz, and W. Litwin. Reliability mechanisms for very large storage systems. In Proceedings of the 20th IEEE / 11th NASA Goddard Conference on Mass Storage Systems and Technologies. IEEE, Apr. 2003. To appear. http://citeseer.ist.psu.edu/xin03reliability.html   More

@misc{ xin03reliability,
  author = "Q. Xin and E. Miller and D. Long and S. Brandt and T. Schwarz and W. Litwin",
  title = "Reliability mechanisms for very large storage systems",
  text = "Q. Xin, E. L. Miller, D. D. E. Long, S. A. Brandt, T. Schwarz, and W. Litwin.
    Reliability mechanisms for very large storage systems. In Proceedings of
    the 20th IEEE / 11th NASA Goddard Conference on Mass Storage Systems and
    Technologies. IEEE, Apr. 2003. To appear.",
  year = "2003",
  url = "citeseer.ist.psu.edu/xin03reliability.html" }
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