A Set of Benchmarks for Modular Testing of SOCs

A Set of Benchmarks for Modular Testing of SOCs (2002)

by Erik Jan Marinissen , Vikram Iyengar , Krishnendu Chakrabarty

Venue:	ITC'02
Citations:	39 - 17 self

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Datum	Value	Source
TITLE	A Set of Benchmarks for Modular Testing of SOCs	user correction - Legacy Corrections
AUTHOR NAME	Erik Jan Marinissen	user correction
AUTHOR AFFIL	Philips Research Laboratories; IC Design – Digital Design & Test; IBM Microelectronics; ASIC Test and Methodology Development	user correction
AUTHOR ADDR	Prof. Holstlaan 4, M/S WAY-41; 5656 AA Eindhoven, The Netherlands; 1000 River Road; Essex Jct, VT 05452, U.S.A.	user correction
AUTHOR NAME	Vikram Iyengar	user correction
AUTHOR AFFIL		user correction
AUTHOR ADDR		user correction
AUTHOR NAME	Krishnendu Chakrabarty	user correction
AUTHOR AFFIL	Duke University; Dept. of Electrical and Computer Eng.	user correction
AUTHOR ADDR	110 Hudson Hall, Box 90291; Durham, NC 27708-0291, U.S.A.	user correction
ABSTRACT	This paper presents the ITC'02 SOC Test Benchmarks. The purpose of this new benchmark set is to stimulate research into new methods and tools for modular testing of SOCs and to enable the objective comparison of such methods and tools with respect to effectiveness and efficiency. The paper defines the benchmark format and naming scheme, and presents the benchmark SOCs. In addition, it provides an overview of the research problems that can be addressed and evaluated by means of this benchmark set. These research problems include the design of optimized test access infrastructures and test schedules.	user correction - Legacy Corrections
YEAR	2002	user correction - Legacy Corrections
VENUE	ITC'02	user correction
CITATIONS	55 found	ParsCit 1.0