Towards a Standard for Embedded Core Test: An Example

Towards a Standard for Embedded Core Test: An Example (1999)

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by Erik Jan Marinissen , Yervant Zorian , Rohit Kapur , Tony Taylor , Lee Whetsel

Venue:	IEEE International Test Conference
Citations:	48 - 9 self

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Datum	Value	Source
TITLE	Towards a Standard for Embedded Core Test: An Example	INFERENCE
AUTHOR NAME	Erik Jan Marinissen	SVM HeaderParse 0.2
AUTHOR AFFIL	Philips Research	SVM HeaderParse 0.2
AUTHOR ADDR	Eindhoven, NL	SVM HeaderParse 0.2
AUTHOR NAME	Yervant Zorian	SVM HeaderParse 0.2
AUTHOR AFFIL	LogicVision	SVM HeaderParse 0.2
AUTHOR ADDR	San Jose, CA	SVM HeaderParse 0.2
AUTHOR NAME	Rohit Kapur	SVM HeaderParse 0.2
AUTHOR AFFIL	Synopsys	SVM HeaderParse 0.2
AUTHOR ADDR	Sunnyvale, CA	SVM HeaderParse 0.2
AUTHOR NAME	Tony Taylor	SVM HeaderParse 0.2
AUTHOR ADDR	Fremont, CA	SVM HeaderParse 0.2
AUTHOR NAME	Lee Whetsel	SVM HeaderParse 0.2
AUTHOR AFFIL	Texas Instruments	SVM HeaderParse 0.2
AUTHOR ADDR	Dallas, TX	SVM HeaderParse 0.2
ABSTRACT	Integrated circuits are increasingly designed by embedding pre-designed reusable cores. IEEE P1500 Standard for Embedded Core Test (SECT) is a standard-under-development that aims at improving ease of reuse and facilitating interoperability with respect to the test of such core-based ICs, especially if they contain cores from different sources. This paper briefly describes IEEE P1500, and illustrates through a simplified example its dual compliance concept, its Scalable Hardware Architecture, and its Core Test Language. Note that this paper provides a preliminary, unapproved view on IEEE P1500. The standard is still under development, and this paper only reflects the view of five active participants of the standardization committee on its current status. 1	SVM HeaderParse 0.2
YEAR	1999	INFERENCE
VENUE	IEEE International Test Conference	INFERENCE
VENUE TYPE	CONFERENCE	INFERENCE
PAGES	616--627	INFERENCE
CITATIONS	18 found	ParsCit 1.0