Fault diagnosis using quantified boolean formulas (2007)
| Venue: | In IEEE Silicon Debug and Diagnosis Workshop (SDD |
| Citations: | 2 - 1 self |
BibTeX
@INPROCEEDINGS{Mangassarian07faultdiagnosis,
author = {Hratch Mangassarian and Andreas Veneris and Marco Benedetti},
title = {Fault diagnosis using quantified boolean formulas},
booktitle = {In IEEE Silicon Debug and Diagnosis Workshop (SDD},
year = {2007}
}
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Abstract
Abstract — Automatic debugging of sequential circuits has been considered a practically intractable task due to the excessive memory and run-time requirements associated with tackling industrial-size problems. This paper proposes a novel Quantified Boolean Formula (QBF) based approach for fault diagnosis in sequential circuits. A performance-driven succinct QBF encoding of the problem, coupled with the tremendous present-day advances in QBF solvers make this strategy a successful one. Extensive experiments on industrial circuits confirm the memory advantage and demonstrate the outstanding performance of the proposed framework. I.
