Test pattern generation using Boolean satisfiability (1992)
| Venue: | IEEE Transactions on Computer-Aided Design |
| Citations: | 227 - 15 self |
BibTeX
@ARTICLE{Larrabee92testpattern,
author = {Tracy Larrabee},
title = {Test pattern generation using Boolean satisfiability},
journal = {IEEE Transactions on Computer-Aided Design},
year = {1992},
pages = {4--15}
}
Years of Citing Articles
Bookmark
 |
 |
 |
 |
 |
 |
OpenURL
Abstract
Abstract-This article describes the Boolean satisfiability method for generating test patterns for single stuck-at faults in combinational circuits. This new method generates test patterns in two steps: First, it constructs a formula expressing the Boolean diference between the unfaulted and faulted circuits. Second, it applies a Boolean satisjiability algorithm to the resulting formula. This approach differs from previous methods now in use, which search the circuit structure directly instead of constructing a formula from it. The new method is general and effective: it allows for the addition of heuristics used by structural search methods, and it has produced excellent results on popular test pattern generation benchmarks. I.
