The effects of energy management on reliability in real-time embedded systems

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The effects of energy management on reliability in real-time embedded systems (2004)

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by Dakai Zhu , Rami Melhem , Daniel Moss

Venue:	In Proc. of the International Conference on Computer Aidded Design (ICCAD
Citations:	72 - 22 self

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@INPROCEEDINGS{Zhu04theeffects,
    author = {Dakai Zhu and Rami Melhem and Daniel Moss},
    title = {The effects of energy management on reliability in real-time embedded systems},
    booktitle = {In Proc. of the International Conference on Computer Aidded Design (ICCAD},
    year = {2004},
    pages = {35--40}
}

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Abstract

Abslracl-The slack time in real-time Systems can be used by re- Previous research either focused on tolerating fixed number roveq schemes to increase system reliability as well PS by frequency and voltage scaling techniques to save energy. Moreover, the rate of transient faults (i.e., soft errors caused, for example, by cosmic ray radiations) PISO depends on system operating frequency and supply voltage. Thus, there is an interesting trade-off hehveen system reliability and energy consumption. This paper first inveStigateS the effects of frequency and voltage sealing on the fault rate and proposes hvo fault rate models based on previously published data. Then, the elfeels of energy management on reliability is studied. Our analysis results show that, energy management through frequency and voltage scaling could dramatically reduce system reliability, and ignoring the elfects of energy management on the fault rate is too optimistic 2nd may lead to unsatisRed system reliability. 1.

Keyphrases

energy management fault rate system reliability energy consumption abslracl-the slack time interesting trade-off hehveen system reliability re previous research hvo fault rate model cosmic ray radiation soft error unsatisred system reliability real-time system number roveq scheme analysis result voltage sealing transient fault voltage scaling supply voltage

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