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Design Experiments for Measurement and Modeling of Digital Substrate Noise Generation (2000)  (Make Corrections)  
Marc van Heijningen, John Compiet, Piet Wambacq, Stephane Donnay



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Abstract: Introduction Substrate Noise Generation . low-level (SPICE) modeling and measurements . Conclusions IMEC 2000 generation propagation impact Goal: simulate substrate noise generation of large digital circuits IMEC 2000 Approach: . Find simple but accurate SPICE substrate models for digital standard cells . Very the SPICE substrate noise simulations with measurements . Develop a high-level substrate noise simulation methodology, based on the SPICE models . At first, for low-ohmic... (Update)

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BibTeX entry:   (Update)

@misc{ heijningen-design,
  author = "Marc van Heijningen and John Compiet and Piet Wambacq and Stephane Donnay",
  title = "Design Experiments for Measurement and Modeling of Digital Substrate Noise
    Generation",
  url = "citeseer.ist.psu.edu/vanheijningen00design.html" }
Citations (may not include all citations):
1   Solid-State Circuits (context) - of, Noise et al. - 2000

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