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Discovering Most Classificatory Patterns for Very Expressive Pattern Classes (2003)  (Make Corrections)  (5 citations)
Masayuki Takeda, Shunsuke Inenaga, Hideo Bannai, Ayumi Shinohara, Setsuo Arikawa
DS 2003



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Abstract: The classificatory power of a pattern is measured by how well it separates two given sets of strings. This paper gives practical algorithms to find the fixed/variable-length-don't-care pattern (FVLDC pattern) and approximate FVLDC pattern which are most classificatory for two given string sets. We also present algorithms to discover the best window-accumulated FVLDC pattern and window-accumulated approximate FVLDC pattern. All of our new algorithms run in practical amount of time by means of... (Update)

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Discovering Most Classificatory Patterns for - Takeda, Inenaga, Bannai.. (2003)   (Correct)

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BibTeX entry:   (Update)

M. Takeda, S. Inenaga, H. Bannai, A. Shinohara, and S. Arikawa. Discovering most classificatory patterns for very expressive pattern classes. Technical Report DOI-TR-CS-219, Department of Informatics, Kyushu University, 2003. http://citeseer.ist.psu.edu/takeda03discovering.html   More

@inproceedings{ takeda03discovering,
  author = "M. Takeda and S. Inenaga and H. Bannai and A. Shinohara and S. Arikawa",
  title = "Discovering most classificatory patterns for very expressive pattern classes",
  booktitle = "DS 2003",
  series = "LNAI",
  volume = "2843",
  year = "2003",
  url = "citeseer.ist.psu.edu/takeda03discovering.html" }
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