We address a number of limitations of Timed Automata and real-time model-checkers, which undermine the reliability of formal verification. In particular, we focus on the model-checker Uppaal as a representative of this technology. Timelocks and Zeno runs represent anomalous behaviours in a timed automaton, and may invalidate the verification of safety and liveness properties. Currently, model-checkers do not offer adequate support to prevent or detect such behaviours. In response, we develop new meth-ods to guarantee timelock-freedom and absence of Zeno runs, which improve and complement the existent support. We implement these methods in a tool to check Uppaal specifications. The requirements language of model-checkers is not well suited to express sequence and iteration of events, or past computations. As a result, validation problems may arise during verification (i.e., the property that we verify may not accurately reflect the intended requirement). We study the logic PITL, a rich propositional subset of Interval Temporal Logic, where these requirements can be more intuitively expressed than in model-checkers. However, PITL has a decision procedure with a worst-case non-elementary complexity, which has hampered the

Computer software must dynamically adapt to changing conditions. In order to fully realize the benefit of dynamic adaptation, it must be performed correctly. The correctness of adaptation cannot be properly addressed without precisely specifying the requirements for adaptation. This paper introduces an approach to formally specifying adaptation requirements in temporal logic. We introduce A-LTL, an adaptation-based extension to linear temporal logic, and use this logic to specify three commonly used adaptation semantics. Composition techniques are developed and applied to A-LTL to construct the specification of an adaptive program. We introduce adaptation semantics graphs to visually represent the adaptation semantics, which can also be used to automatically generate specification for adaptive programs. Key words: