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Abstract: The Advanced VLIW architecture of the Equator MAP1000 processor has many features that present significant verification challenges. We describe a functional verification methodology to address this complexity. In particular, we present an efficient method to generate directed assembly tests and a novel technique using the processor itself to control self-tests and check the results at speed using native instructions only. We also describe the use of emulation in both pre-silicon and... (Update)
Context of citations to this paper: More
.... sheets [19] Generation of effective test programs for the self test of a processor has been studied by several researchers ( 2] 18] 20] [21]) Ur and Yadin [23] presented a method for generation of assembler test programs that systematically probe the micro architecture of...
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Functional Coverage Driven Test Generation for - Validation Of Pipelined (Correct)
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2: Test program generation for functional verification of PowerPC processors in IBM - Aharon, Goodman et al. - 1995
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BibTeX entry: (Update)
J. Shen et al. Functional Verification of the Equator MAP1000 Microprocessor. DAC, 1999. http://citeseer.ist.psu.edu/shen99functional.html More
@inproceedings{ shen99functional,
author = "Jian Shen and Jacob A. Abraham and Dave Baker and Tony Hurson and Martin Kinkade and Gregorio Gervasio and Chen-chau Chu and Guanghui Hu",
title = "Functional Verification of the Equator MAP1000 Microprocessor",
booktitle = "Design Automation Conference",
pages = "169-174",
year = "1999",
url = "citeseer.ist.psu.edu/shen99functional.html" }
Citations (may not include all citations):34 Test Program Generation for Functional Verification of Power.. - Aharon, Goodman et al. - 1995
6 Functional verification of the HP PA 8000 processor (context) - Mangelsdorf, Gratias et al. - 1997
5 m Done Simulating; Now What (context) - Kantrowitz, Noack - 1996
4 Native Mode Functional Test Generation for Microprocessors w.. (context) - Shen, Abraham - 1998
2 and debugging of the HP PA 7200 processor (context) - Alexander, Dickey et al. - 1996
2 Simplified Microprocessor Test Generation (context) - Hinchcliff - 1982
1 Self Test for the Intel (context) - Goor, Jansen - 1990
Documents on the same site (http://www.ece.utexas.edu/~jshen/research.html): More
Synthesis of Native Mode Self-Test Programs - Shen, Abraham (Correct)
An RTL Abstraction Technique for Processor Microarchitecture.. - Shen, Abraham (1999) (Correct)
Functional Self-Test Generation for Superscalar Microprocessors - Jian Shen Jacob (Correct)
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