of arbitrary, low-frequency incident lighting into transferred radiance which includes global effects like shadows and interreflections from the object onto itself. At run-time, these transfer functions are applied to actual incident lighting. Dynamic, local lighting is handled by sampling it close

Summary. Synthetic mixtures of CaO and F%O 3 fired in air at temperatures in the range 1180 ~ C to 1240 ~ C in some cases lost oxygen and formed ferrous-iron-bearing compounds. Samples after firing were examined by incident light micro-scopy and X-ray diffraction; new powder data are presented

A new general reflectance model for computer graphics is presented. The model is based on physical optics and describes specular, directional diffuse, and uniform diffuse reflection by a surface. The reflected light pattern depends on wavelength, incidence angle, two surface roughness parameters

, point and color data types, control flow constructs that support the casting of outgoing and the integration of incident light, a clearly specified interface to the rendering system using global state variables, and a host of useful built-in functions. The design issues and their impact

layers of the objects being imaged and the distribution of light sources. Recently, a unified approach to the specification of surface reflectance in terms of both incident and reflected beam geometry has been proposed The reflecting properties of a surface are specified in terms of the bidirectional

that often render them more usable than physical models. However, geometrical models are applicable only when the wavelength of incident light is small compared to the dimensions of the surface imperfections. Therefore, it is incorrect to use these models to interpret or predict reflections from smooth

We present an image-based technique to relight real objects illuminated by a 4D incident light field, representing the illumination of an environment. By exploiting the richness in angular and spatial variation of the light field, objects can be relit with a high degree of realism. We record

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sensors with spectral sensitivities given by fR (), fG () and fB () respectively, to obtain an image of the surface patch illuminated by a SPD of the incident light denoted by e(), the measured sensor values will be given by Shafer [5]: C = m b (n; s) Z

distribution of the incident light. We then use this information to process the photograph digitally to alter the lighting on the object. Inverse lighting is a specific example of the general idea of inverse rendering. This refers to the practice of using the methods of computer graphics, which normally