This document will describe materials and devices that are being considered for observing and measuring beam profiles in AHF. This discussion deals primarily with the physics design of profile observing devices as opposed to engineering considerations. No decisions or recommendations are made here

A beam profile monitor by the use of adaptive optics system was constructed and tested for the design study of SR monitor for B-factory. The Shack-Hartmann wavefront sensor was designed and constructed for a measurement of wavefront error caused by a deformation of an extraction mirror for visible

focused beam compares to the expected Gaussian profile. Verification that our implementation of the knife-edge method works is given by a strong linear relationship between our observed data and a standard Gaussian integral, for the most part strong nonlinear direct fits of experimental response curves

rates were affected by the distortion of the spatial beam profile. These results suggest the possibility to control the characteristics of the modified region by controlling the beam profile. 1.

modification of the transverse beam pro-file which can be observed in different profile monitors in HERA. The time–like evolution of the electron beam shape during luminosity tuning and before and after dump of the proton beam, averaged over all bunches, can be studied by means of a synchrotron radiation

A fast photodiode was demonstrated to be able to extract the turn by turn photon beam profile information of electron storage rings if the photodiode was operated at the saturated region. When applied this method to a 1.3 GeV synchrotron light source with 200 mA beam current, the synchrotron

A) have been measured. However, several difficulties emerge to explain the difference shape between the transverse beam profiles deduced from the elementary observation of the emitted light by a C.C.D. camera, a grid profiler (low duty cycle operation) and a residual gas profiler, respectively. More

gated camera by adding, inexpensively, some features of a dual-axis streak camera, in order to watch the turn-by-turn evolution of the transverse profile, in both x and y. The beam’s elliptical profile is reshaped using cylindrical lenses to form a tall and narrow ellipse—essentially the projection

.5 mm), depends on the observed beam size. They are used in the 1 to 300 nAe beam intensity range, and for beam energies ranging from a few KeV/u up to 100 MeV/u. 150 such S.E.M. are installed all along the beam transfer lines _ between the 3 GANlL cyclotrons and on the experimental areas. GAS PROFILE

-sectional images. The output beams have the profile of Bessel function after intensity modulation, and the beams extend at least 50mmwhile the lateral dimension of the spot remains nearly invariant. Furthermore, the self-healing property has also been investigated, and all the experimental results agree well