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Abstract: We investigate a characterization of hard-to-detect bridging faults. For circuits with large numbers of lines (or nodes), this characterization can be used to select target faults for test generation when it is impractical to target all the bridging faults (or all the realistic bridging faults). We demonstrate that the faults selected based on the proposed characterization are indeed hard-to-detect by showing that the fault coverage of a given test set with respect to this subset is lower and... (Update)
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BibTeX entry: (Update)
@misc{ pomeranz-characterization,
author = "Irith Pomeranz and Sudhakar M. Reddy and Sandip Kundu",
title = "On the Characterization of Hard-to-Detect Bridging Faults",
url = "citeseer.ist.psu.edu/pomeranz03characterization.html" }
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22 Biased Voting: A Method for Simulating CMOS Bridging Faults .. (context) - Maxwell, Aitken
21 A CMOS Fault Extractor for Inductive Fault Analysis (context) - Ferguson, Shen - 1988
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