See this document in CiteSeerX!

Worst-Case Analysis and Optimization of VLSI Circuit Performances (1995)  (Make Corrections)  (4 citations)
A. Dharchoudhury, S.M. Kang



  Home/Search   Context   Related

 
View or download:
uiuc.edu/people/abhijit/tcad.ps
Cached:  PS.gz  PS  PDF   Image  Update  Help

From:  uiuc.edu/people/ab...iedison3_pub (more)
(Enter author homepages)

Rate this article: (best)
  Comment on this article  
(Enter summary)

Abstract: In this paper, we present a new approach for realistic worst-case analysis of VLSI circuit performances and a novel methodology for circuit performance optimization. Circuit performance measures are modeled as response surfaces of the designable and uncontrollable (noise) parameters. Worst-case analysis proceeds by first computing the worst-case circuit performance value and then determining the worst-case noise parameter values by solving a nonlinear programming problem. A new circuit... (Update)

Similar documents based on text:   More   All
0.4:   Mismatch Analysis and Direct Yield Optimization by .. - Schenkel.. (2001)   (Correct)
0.3:   Some Recent Progress on the Complexity of Lattice Problems - Cai (1999)   (Correct)
0.3:   Automatic Circuit Characterization - Computer Experiments Through   (Correct)

BibTeX entry:   (Update)

A. Dharchoudhury and S. M. Kang. Worst-Case Analysis and Optimization of VLSI Circuit Performances. In IEEE Trans. Circuits and Systems (CAS), volume 14, pages 481--492, Apr. 1995. http://citeseer.ist.psu.edu/dharchoudhury95worstcase.html   More

@misc{ dharchoudhury95worstcase,
  author = "A. Dharchoudhury and S. Kang",
  title = "Worst-Case Analysis and Optimization of VLSI Circuit Performances",
  text = "A. Dharchoudhury and S. M. Kang. Worst-Case Analysis and Optimization of
    VLSI Circuit Performances. In IEEE Trans. Circuits and Systems (CAS), volume
    14, pages 481--492, Apr. 1995.",
  year = "1995",
  url = "citeseer.ist.psu.edu/dharchoudhury95worstcase.html" }
Citations (may not include all citations):
530   Linear and Nonlinear Programming (context) - Luenberger - 1984
119   Empirical Model-Building and Response Surfaces (context) - Box, Draper - 1987
71   A comparison of three methods for selecting values of input .. (context) - McKay, Beckman et al. - 1979
56   Statistics for Experimenters: An Introduction to Design (context) - Box, Hunter et al. - 1978
23   A survey of optimization techniques for integrated circuit d.. (context) - Brayton, Hachtel et al. - 1981
17   DELIGHT.SPICE: an optimization-based system for the design o.. (context) - Nye, Riley et al. - 1988
8   ILLIADS: a fast timing and reliability simulator for digital.. (context) - Shih, Leblebici et al. - 1993
6   User's guide for NPSOL, version 4.0 (context) - Gill, Murray et al. - 1986
6   A new methodology for the design centering of IC fabrication.. (context) - Low, Director - 1991
5   Integrated circuit design optimization using a sequential st.. (context) - Bernardo, Buck et al. - 1992
4   Statistical performance modeling and parametric yield estima.. (context) - Yu, Kang et al. - 1987
4   An integrated approach to realistic worst-case design optimi.. - Dharchoudhury, Kang - 1992
3   An efficient methodology for building macromodels of IC fabr.. (context) - Low, Director - 1989
2   Limit-parameters: the general solution of the worst-case pro.. (context) - Muller-L - 1990
2   Modification of the Banu-Tsividis continuous-time integrator.. (context) - Czarnul - 1986

[Article contains additional citations not shown here]

Documents on the same site (http://www.ccsm.uiuc.edu/people/abhijit/iedison3_pub.html):   More
An Integrated Approach to Realistic Worst-Case Design.. - Dharchoudhury, Kang (1992)   (Correct)
Performance-Constrained Worst-Case Variability Minimization .. - Dharchoudhury, Kang (1993)   (Correct)
User's Guide for iEDISON3.0: A Statistical Design Tool for.. - Dharchoudhury And   (Correct)

Online articles have much greater impact   More about CiteSeer.IST   Add search form to your site   Submit documents   Feedback  

CiteSeer.IST - Copyright Penn State and NEC