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Abstract: Reliability assessment is an important part of the design process of digital integrated circuits. We observe that a common thread that runs through most causes of run-time failure is the extent of circuit activity, i.e., the rate at which its nodes are switching. We propose a new measure of activity, called the transition density, which may be defined as the "average switching rate" at a circuit node. Based on a stochastic model of logic signals, we rigorously define the transition density and... (Update)
Context of citations to this paper: More
...roots and are strongly correlated. The strength of the correlation is represented by , which can be obtained using a probabilistic approach [11] [13] X. ONGOING FUTURE WORKS A. Stability Analysis Although the exact is stable as shown in (31) the stability for the one pole...
.... of a circuit and certain statistics of its input signals such as the average signal probability or average transition density [9]. This abstract mapping hides the implementation details of a circuit while allowing its evaluation under the workload of the specific...
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BibTeX entry: (Update)
F. Najm, "Transition Density, A Stochastic Measure of Activities in Digital Circuits", DAC, pp. 644-649, 1991. http://citeseer.ist.psu.edu/najm91transition.html More
@inproceedings{ najm91transition,
author = "Farid N. Najm",
title = "Transition Density, A Stochastic Measure of Activity in Digital Circuits",
booktitle = "Design Automation Conference",
pages = "644--649",
year = "1991",
url = "citeseer.ist.psu.edu/najm91transition.html" }
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316 Efficient implementation of a BDD package (context) - Brace, Rudell et al. - 1990 ACM DBLP
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51 Probabilistic simulation for reliability analysis of CMOS VL.. - Najm, Burch et al. - 1990
27 PREDICT - probabilistic estimation of digital circuit testab.. (context) - Seth, Pan et al. - 1985
25 Random pattern testability (context) - Savir, Ditlow et al. - 1984 DBLP
21 NY: McGraw-Hill Book Co (context) - Papoulis, Random et al. - 1984
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5 CA: Holden-Day Inc (context) - Parzen, Processes et al. - 1962
3 Bounding signal probabilities in combinational circuits (context) - Markowsky - 1987 ACM DBLP
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