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Abstract: This paper deals with the estimation of the median time-to-failure (MTF) due to electromigration in the power and ground busses of CMOS VLSI circuits. In our previous work [3, 4], we presented a novel technique for MTF estimation based on a stochastic current waveform model. In [6], we argued that including the variance waveform of the current, in addition to its expected waveform derived in [3, 4], would further improve the accuracy of the MTF estimate. In this paper, we present a novel... (Update)
Context of citations to this paper: More
.... the details of step 1, along with its implementation in the probabilistic simulator CREST, will be presented in a forth coming paper [8] (as well as in [9] The other two steps will be described below. The critical issue is the correlation between the different current...
...(over SPICE) of over 11500X on a 648 transistor CMOS parallel multiplier circuit. Preliminary results of this research have appeared in [6] and [7]. 2. Stochastic Current Waveforms and the MTF Consider a metal line of uniform width and thickness carrying a constant current. Due...
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BibTeX entry: (Update)
F. Najm, I. Hajj, and P. Yang, "Computation of bus current variance for reliability estimation of VLSI circuits", To appear in IEEE International Conference on ComputerAided Design, Santa Clara, CA, November 6--9, 1989. http://citeseer.ist.psu.edu/najm89computation.html More
@inproceedings{ najm89computation,
author = "F. Najm and I. Hajj and P. Yang",
title = "Computation of bus current variance for reliability estimation of {VLSI}
circuits",
booktitle = "IEEE International Conference on Computer-Aided Design, Santa Clara, CA,
November 6--9, 1989.",
year = "1989",
url = "citeseer.ist.psu.edu/najm89computation.html" }
Citations (may not include all citations):51 Probabilistic simulation for reliability analysis of VLSI ci.. - Najm - 1989
30 Pattern-independent current estimation for reliability analy.. - Burch, Najm et al. - 1988
21 NY: McGraw-Hill Book Co (context) - Papoulis, Random et al. - 1984
11 Electromigration failure modes in aluminum metallization for.. (context) - Black - 1969
8 CREST - a current estimator for CMOS circuits - Najm, Burch et al. - 1988
4 Electromigration and failure in electronics : an introductio.. (context) - d'Heurle - 1971
3 Electromigration median time-to-failure based on a stochasti.. - Najm, Hajj et al. - 1989
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