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An Efficient Mixed-Mode Bist Technique (2004)  (Make Corrections)  (6 citations)
Petr Fiser, Hana Kubtov Department of Computer Science and Engineering Czech...



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Abstract: We propose a new built-in self-test (BIST) method based on a combination of a pseudo-random test method with a deterministic test. This enables us to reach a high fault coverage in a short test time and with a low area overhead. The main feature of the method is that there are no memory elements to store the deterministic test patterns; the test patterns are being produced by a transformation of the non-testing pseudo-random patterns. This transformation is being done by a purely... (Update)

Cited by:   More
Postgraduate Study Report DC-PSR-2004-14 - Mixed-Mode Bist Based   (Correct)
Pseudorandom Testing -- A Study of the Effect of the Generator .. - Petr Fiser Hana   (Correct)
Survey of the Algorithms in the Column-Matching BIST Method - Petr Fiser Hana   (Correct)

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0.8:   Influence of the Test Lengths on Area Overhead in Mixed-Mode.. - Petr Fiser Hana (2004)   (Correct)
0.6:   Mixed-Mode Bist Based On Column Matching - Petr Fiser Informatics (2004)   (Correct)
0.5:   Pseudorandom Testability -- Study of the Effect of the - Generator Type Petr   (Correct)

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6:   Synthesis of mapping logic for generating transformed pseudo-random patterns for.. - Touba, McCluskey - 1995
6:   Column- Matching BIST Exploiting Test Don't-Cares - Fiser, Hlavi et al. - 2003
6:   A BIST pattern generator design for near-perfect fault coverage - Chatterjee, Pradhan - 2003

BibTeX entry:   (Update)

P. Fiser and H. Kubtov, "An Efficient Mixed-Mode BIST Technique", Proc. 7th IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2004. http://citeseer.ist.psu.edu/fiser04efficient.html   More

@misc{ fiser04efficient,
  author = "P. Fiser and H. Kubtov",
  title = "An Efficient Mixed-Mode BIST Technique",
  text = "P. Fiser and H. Kubtov, An Efficient Mixed-Mode BIST Technique, Proc. 7th
    IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop
    2004.",
  year = "2004",
  url = "citeseer.ist.psu.edu/fiser04efficient.html" }
Citations (may not include all citations):
171   Synthesis and Optimization of Digital Circuits (context) - De Micheli - 1994
93   Combinational Profiles of Sequential Benchmark Circuits (context) - Brglez, Bryan et al. - 1989
76   A Neutral Netlist of 10 Combinational Benchmark Circuits and.. (context) - Brglez, Fujiwara - 1985
30   Built-In Test for Circuits with Scan Based on Reseeding of M.. (context) - Hellebrand - 1995
29   Synthesis of mapping logic for generating transformed pseudo.. - Touba - 1995
18   How to Do Weighted Random Testing for BIST (context) - Hartmann, Kemnitz - 1993
17   BOOM - a Heuristic Boolean Minimizer (context) - ka, Fiser - 2001
17   BOOM - A Heuristic Boolean Minimizer (context) - Fiser, Hlavi - 2003
16   A Mixed Mode BIST Scheme Based on reseeding of Folding Count.. - Hellebrand, Liang et al. - 2000
9   Column-Matching BIST Exploiting Test Don't-Cares - Fiser, Hlavi et al. - 2003
9   A BIST Pattern Generator Design for Near-Perfect Fault Cover.. - Chatterjee, Pradhan - 2003
7   Atalanta: an Efficient ATPG for Combinational Circuits (context) - Lee, Ha - 1993
http://service.felk.cvut.cz/vlsi/prj/BOOM
http://service.felk.cvut.cz/vlsi/prj/ColMatch

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Efficient Minimization Method For - Incompletely Defined Boolean   (Correct)
Boolean Minimizer FC-Min: Coverage Finding Process - Petr Fiser Hana   (Correct)
Coverage-Directed Assignment Approach To BIST - Fiser, Hlavicka, Kubatova (2003)   (Correct)

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