(Enter summary)
Abstract: We propose a new built-in self-test (BIST) method based on a
combination of a pseudo-random test method with a deterministic test. This
enables us to reach a high fault coverage in a short test time and with a low
area overhead. The main feature of the method is that there are no memory
elements to store the deterministic test patterns; the test patterns are being
produced by a transformation of the non-testing pseudo-random patterns. This
transformation is being done by a purely... (Update)
Cited by: More
Postgraduate Study Report DC-PSR-2004-14 - Mixed-Mode Bist Based
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Pseudorandom Testing -- A Study of the Effect of the Generator .. - Petr Fiser Hana
(Correct)
Survey of the Algorithms in the Column-Matching BIST Method - Petr Fiser Hana
(Correct)
Active bibliography (related documents): More All
0.8: Influence of the Test Lengths on Area Overhead in Mixed-Mode.. - Petr Fiser Hana (2004)
(Correct)
0.6: Mixed-Mode Bist Based On Column Matching - Petr Fiser Informatics (2004)
(Correct)
0.5: Pseudorandom Testability -- Study of the Effect of the - Generator Type Petr
(Correct)
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BibTeX entry: (Update)
P. Fiser and H. Kubtov, "An Efficient Mixed-Mode BIST Technique", Proc. 7th IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2004. http://citeseer.ist.psu.edu/fiser04efficient.html More
@misc{ fiser04efficient,
author = "P. Fiser and H. Kubtov",
title = "An Efficient Mixed-Mode BIST Technique",
text = "P. Fiser and H. Kubtov, An Efficient Mixed-Mode BIST Technique, Proc. 7th
IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop
2004.",
year = "2004",
url = "citeseer.ist.psu.edu/fiser04efficient.html" }
Citations (may not include all citations):
171
Synthesis and Optimization of Digital Circuits (context) - De Micheli - 1994
93
Combinational Profiles of Sequential Benchmark Circuits (context) - Brglez, Bryan et al. - 1989
76
A Neutral Netlist of 10 Combinational Benchmark Circuits and.. (context) - Brglez, Fujiwara - 1985
30
Built-In Test for Circuits with Scan Based on Reseeding of M.. (context) - Hellebrand - 1995
29
Synthesis of mapping logic for generating transformed pseudo..
- Touba - 1995
18
How to Do Weighted Random Testing for BIST (context) - Hartmann, Kemnitz - 1993
17
BOOM - a Heuristic Boolean Minimizer (context) - ka, Fiser - 2001
17
BOOM - A Heuristic Boolean Minimizer (context) - Fiser, Hlavi - 2003
16
A Mixed Mode BIST Scheme Based on reseeding of Folding Count..
- Hellebrand, Liang et al. - 2000
9
Column-Matching BIST Exploiting Test Don't-Cares
- Fiser, Hlavi et al. - 2003
9
A BIST Pattern Generator Design for Near-Perfect Fault Cover..
- Chatterjee, Pradhan - 2003
7
Atalanta: an Efficient ATPG for Combinational Circuits (context) - Lee, Ha - 1993
http://service.felk.cvut.cz/vlsi/prj/BOOM
http://service.felk.cvut.cz/vlsi/prj/ColMatch
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Efficient Minimization Method For - Incompletely Defined Boolean
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Boolean Minimizer FC-Min: Coverage Finding Process - Petr Fiser Hana
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Coverage-Directed Assignment Approach To BIST - Fiser, Hlavicka, Kubatova (2003)
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