# M. B. Santos, J. Braga, P. Coimbro, J. P. Teixeira, S. Manich and L. Balado, "RTL Guided Random-Pattern-Resistant Fault Detection and Low Energy BIST", Proc. IEEE Design and Diagnostic of Electronic Circuits & Systems (DDECS), pp.37-43, 2001. Home/Search Document Details and Download
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