R. Golem and I. Cohen, "Scanning electron microscope image enhancement, " Technical Report Chool of Computer and Electrical Engineering Project Report, Ben-Gurion University, 1998. Home/Search Document Not in Database Summary Related Articles Check |
This paper is cited in the following contexts:
Transformation-Invariant Clustering and Dimensionality.. - Frey, Jojic (2000) (3 citations) (Correct)
....clutter and spatial transformations, such as translation, rotation and shearing. For example, Fig. 1 shows several 140 56 pixel greyscale images obtained from a scanning electron microscope. The electron detectors and the highspeed electrical circuits randomly translate the images and add noise [1]. Standard filtering techniques are not appropriate here, since the images are not aligned. Due to the high level of noise, it is difficult to properly align them by hand and this requires human effort. Fig. 2 shows several 44 28 pixel greyscale head andshoulder images of a person walking ....
....reveal more structure and less uncertainty. V. EXPERIMENTS A. Filtering images from a scanning electron microscope (SEM) SEM images (e.g. Fig. 7a) can have a very low signal to noise ratio due to a high variance in electron emission rate and modulation of this variance by the imaged material [1]. To reduce noise, multiple images are usually averaged and the pixel variances can be used to estimate certainty in rendered structures. Fig. 7b shows the estimated means and variances of the pixels from 230 140 56 SEM images like the ones in Fig. 7a. In fact, averaging images does not take ....
R. Golem and I. Cohen, "Scanning electron microscope image enhancement, " Technical Report Chool of Computer and Electrical Engineering Project Report, Ben-Gurion University, 1998.
Topographic Transformation as a Discrete Latent Variable - Jojic, Frey (2000) (7 citations) (Correct)
....is held constant at a uniform distribution. 4 Experiments 4.1 Filtering Images from a Scanning Electron Microscope (SEM) SEM images (e.g. Fig. 2a) can have a very low signal to noise ratio due to a high variance in electron emission rate and modulation of this variance by the imaged material (Golem and Cohen, 1998). To reduce noise, multiple images are usually averaged and the pixel variances can be used to estimate certainty in rendered structures. Fig. 2b shows the estimated means and variances of the pixels from 230 140 56 SEM images like the ones in Fig. 2a. In fact, averaging images does not take ....
R. Golem and I. Cohen 1998. Scanning electron microscope image enhancement. School of Computer and Electrical Engineering project report, Ben-Gurion University.
Topographic Transformation as a Discrete Latent Variable - Nebojsa Jojic Brendan (2000) (7 citations) (Correct)
....is held constant at a uniform distribution. 4 Experiments 4.1 Filtering Images from a Scanning Electron Microscope (SEM) SEM images (e.g. Fig. 2a) can have a very low signal to noise ratio due to a high variance in electron emission rate and modulation of this variance by the imaged material (Golem and Cohen, 1998). To reduce noise, multiple images are usually averaged and the pixel variances can be used to estimate certainty in rendered structures. Fig. 2b shows the estimated means and variances of the pixels from 230 140 56 SEM images like the ones in Fig. 2a. In fact, averaging images does not take ....
R. Golem and I. Cohen 1998. Scanning electron microscope image enhancement. School of Computer and Electrical Engineering project report, Ben-Gurion University.
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