| L. B. Wolff. Polarization-based material classification from specular reflection. PAMI, 12(11):1059--1071, 1990. |
.... occurring example is the presence of reflections on glass, for example when viewing a painting framed behind glass (Figure 1) Because it provides a simple illustration we will focus on the problem of separating reflections from glass while leaving intact the image of objects behind the glass (see [10, 4, 11, 9] The authors gratefully acknowledge support from NIH Grant EY11005 04 and MURI Grant N00014 95 1 0699. Figure 1: Renoir s On the Terrace, Sheila and Sheila s reflection. for different approaches to removing specular reflections) We will show later how the same general techniques can be used to ....
L. Wolff. Polarization-based material classification from specular reflection. IEEE Transactions on Pattern Analysis and Machine Intelligence, 12(11):1059--1071, 1990.
....surfaces where the reflection is highly localized and poses a problem for various computer vision algorithms such as stereo and motion estimation. These approaches fall into one of several general categories: imposing a Lambertian assumption [2] color based [3, 4, 5] polarization based [6, 7] and combinations thereof [8] Here we concern ourselves with the problem of removing reflections from a planar surface and take a completely different computational approach than previously suggested. Another important distinction is that in removing the reflections off the Figure 1: Renoir s On ....
L.B. Wolff. Polarization-based material classification from specular reflection. IEEE Transactions on Pattern Analysis and Machine Intelligence, 12(11):1059--1071, 1990.
....To date, some investigation of II s has been conducted for visible imagery, but practically none has been reported for non visible imagery. Examples of II s in computer vision include color features for object recognition [14] 15] 16] and polarization cues for material identification [17]. A more direct example of this approach computes ratios of albedos of homogeneous image intensity patches within objects in visible imagery [18] DRAFT May 17, ROBUST THERMOPHYSICS BASED INTERPRETATION 3 Non visible modalities of sensing have been shown to greatly increase the amount of ....
L.B. Wolff, "Polarization-based material classification from specular reflection", IEEE Trans PAMI, Nov 1990, pp 1059-1071.
.... the conics, lines and or points that are used for specifying geometric invariants (GI s) when analyzing visible wavelength imagery [1] Thus, in addition to the currently available techniques of formulating features that depend only on external shape [2] 10] and surface reflectance properties [11] [16] the phenomenology of LWIR image generation can be used to establish new features that uncover the composition and thermal state of the object, and which do not depend on surface reflectance characteristics. An intuitive approach to thermo physical interpretation of LWIR imagery is ....
L.B. Wolff, "Polarization-based material classification from specular reflection", IEEE Trans PAMI, Nov 1990, pp 1059-1071.
....from albedo variations, sharp surface discontinuities, and shadows. This paper presents yet another distinct application of using reflected polarization as a new sensory medium in computer vision. Previously polarization based computations have been applied to material classification [23] [21], separation of reflection components [18] 20] and determination of surface orientation [9] 10] 17] 19] The Fresnel reflectance model for polarization used in a number of these previous applications has recently been extended to include partial polarization of the diffuse component at ....
L.B. Wolff. Polarization-based material classification from specular reflection. IEEE Transactions on Pattern Analysis and Machine Intelligence (PAMI), 12(11):1059--1071, November 1990.
....Understanding but rather that the use of polarization information can directly enhance the capabilities and or simplify certain important Image Understanding tasks beyond what intensity and color can accomplish. This was shown to be true for tasks such as dielectric metal discrimination in images [13], segmentation of specularities [12] 18] quantitative separation of specular and diffuse reflection components [12] 18] 10] and, direct identification of occluding contours [18] 2] Polarization being orthogonal to wavelength (i.e. color) and a more general physical characteristic of ....
....of polarization vision was still hindered by the fact that commercially available video imaging cameras are geared to sense only intensity and color. The sensing of polarization requires optical components not available in existing video cameras for Computer Vision. Results presented in [14] [13], 18] used a monochrome intensity CCD camera with a mechanically rotating linear polarizing filter placed in front of the camera lens. Multiple images were obtained with respect to different orientations of the polarizing filter three polarization component images are required for a complete ....
L.B. Wolff. Polarization-based material classification from specular reflection. IEEE Transactions on Pattern Analysis and Machine Intelligence (PAMI), 12(11):1059--1071, November 1990.
....cannot distinguish between a target vehicle and a decoy replica of the vehicle painted on canvas while polarization vision has the strong potential to distinguish such decoys from actual targets under a number of circumstances. Polarization also has the ability to distinguish metal and dielectric [9]. This Fall 1994 under sponsorship of ARPA a collaborative effort between Johns Hopkins and Martin Marietta will begin studying Automatic Target Detection using Polarization Vision empirically testing out some of these ideas. Johns Hopkins will be installing modular components described above on ....
L.B. Wolff. Polarization-based material classification from specular reflection. IEEE Transactions on Pattern Analysis and Machine Intelligence (PAMI), 12(11):1059--1071, November 1990.
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L. B. Wolff. Polarization-based material classification from specular reflection. PAMI, 12(11):1059--1071, 1990.
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L.B. Wolff, "Polarization-based material classification from specular reflection," IEEE Trans. Patt. Anal. Mach. Intell., 12(11), pp.1059-1071, 1990.
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L.B. Wolff, "Polarization-Based Material Classification from Specular Reflection, " IEEE Trans. Pattern Analysis and Machine Intelligence, 2, no. 1. pp.1 Nov.1 L.B. Wolff and T.E. Boult, "Constraining Object Features Using a Polarization Reflectance Model," IEEE Trans. Pattern Analysis and Machine Intelligence, vol. 1. no. 7, pp. 635-657, July 1ly
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L. B. Wolff. Polarization-based material classification from specular reflection. IEEE Trans. Patt. Anal. Mach. Intell., 12(11):1059--1071.
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Wolff, L.B.: Polarization-based Material Classification from Specular Reflection, IEEE Trans. Pattern Analysis and Machine Intelligence,Vol. 12, No. 11, pp. 1059-1071 (1990).
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L.B. Wolff, "Polarization-based material classi- fication from specular reflection", IEEE Trans PAMI, Nov 1990, pp 1059-1071.
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L.B. Wolff, "Polarization-based material classification from specular reflection", IEEE Trans PAMI, Nov 1990, pp 1059-1071.
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