M. Saraiva, P. Casimiro, M. Santos, J.T. Sousa, F. Goncalves, I Teixeira, and J.P. Teixeira. Physical DFT for high coverage of realistic faults. In Proceedings of International Test Conference, pages 642--647. IEEE, 1992. Home/Search Document Not in Database Summary Related Articles Check |
This paper is cited in the following contexts:
Incorporating Physical Design-For-Test into Routing - Richard Mcgowen (1997) (Correct)
....resistance to stuck at test sets [17] and in their paper Work was done while at the Univercity of California Santa Cruz. that extended this work for bridging faults, Saraiva et al. proposed identifying difficult to test routing areas and increasing the distance between lines in those areas [18]. Khare and Maly presented a testability measure and proposed using an iterative process and their measure to select the most testable of several solutions [19] Ferguson said that routing could be used to avoid placing lines adjacent to each other if a short between them would cause feedback ....
....method for finding a large number of T BFs during routing could be found. Researchers have found characteristics that predict the difficulty of detecting a BF. Kapur et al. 32] studied the relationship of controllability and observability to detectability. Teixeira et al. 17] and Saraiva et al. [18] divided faults into categories based on their resistance to stuck at tests and suggested using the hardness of a category to drive DFT efforts. The problem with these techniques is that large numbers of detectable BFs would be targeted and some undetectable BFs would not. By targeting a large ....
M. Saraiva, P. Casimiro, M. Santos, J. Sousa, F. Gon¸calves, I. Teixeira, and J. Teixeira, "Physical DFT for high coverage of realistic faults," in Proceedings of International Test Conference, pp. 642--647, IEEE, 1992.
VHDL Fault Simulation for Defect-Oriented Test and .. - Celeiro, Dias.. (1996) (1 citation) Self-citation (Santos Teixeira) (Correct)
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M. Saraiva, P. Casimiro, M. Santos, J.T. Sousa, F.M. Gonalves, I. Teixeira, J.P. Teixeira, "Physical DFT for High Coverage of Realistic Faults", Proc. Int. Test Conference (ITC), pp. 642-651, Sept., 1992.
Defect Level Evaluation in an IC Design Environment - Sousa, Gonçalves.. (1996) (3 citations) Self-citation (Sousa Gonalves Teixeira) (Correct)
....whereas other faults which cannot physically occur are included in the fault list. In view of such abstract fault model, equiprobable faults are assumed, which strongly deviates from the reality. As a consequence, single LSA fault coverage, T, can be a misleading metric for test quality [5 7], and both Y and T may loose validity and meaning, as con rmed also by observation on production chips [8] The purpose of this paper is to present a methodology for the evaluation of the Defect Level in an IC design environment. The methodology is based on the extension of the Williams Brown ....
....weighted fault coverage; on the contrary, classes with high fault incidences have a dominant role in# . As an example, it has been shown, for a particular case of a digital, 2 metal CMOS process, and a standard cell design style, that typically 45 of extracted faults are bridging (BRI) faults [7]; however, their incidence is as high as 95 , due to the greater density of defects associated with bridging mechanisms, in a positive photoresist process. Note that class fault incidences can be computed from the circuit netlist and the fault set, without simulation. This implies that the ....
[Article contains additional citation context not shown here]
M. Saraiva, P. Casimiro, M. Santos, J.T. Sousa, F.M. Gonalves, I. Teixeira, and J.P. Teixeira, Physical DFT for High Coverage of Realistic Faults, Proc. Int. Test Conference (ITC), pp. 642-651, 1992.
Eliminating Undetectable Shorts between Horizontal Wires.. - McGowen, Ferguson (1994) (Correct)
No context found.
M. Saraiva, P. Casimiro, M. Santos, J.T. Sousa, F. Goncalves, I Teixeira, and J.P. Teixeira. Physical DFT for high coverage of realistic faults. In Proceedings of International Test Conference, pages 642--647. IEEE, 1992.
Elimination of Undetectable Shorts During Channel Routing - McGowen, Ferguson (1994) (Correct)
No context found.
M. Saraiva, P. Casimiro, M. Santos, J.T. Sousa, F. Goncalves, I Teixeira, and J.P. Teixeira. Physical DFT for high coverage of realistic faults. In Proceedings of International Test Conference, pages 642--647. IEEE, 1992.
Objective-Based Routing For Physical Design-For-Test - McGowen (1995) (Correct)
No context found.
M. Saraiva, P. Casimiro, M. Santos, J.T. Sousa, F. Gon¸calves, I Teixeira, and J.P. Teixeira. Physical DFT for high coverage of realistic faults. In Proceedings of International Test Conference, pages 642--647. IEEE, 1992. 87
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