F. Brglez, P. Pownall, P. Hum, "Applications of Testability Analysis: From ATPG to Critical Path Tracing", Proc. Int. Test Conf., pp.705-712, 1984. Home/Search Document Not in Database Summary Related Articles Check |
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Symbolic Boolean Manipulation with Ordered Binary Decision Diagrams - Bryant (1992) (494 citations) (Correct)
....with complex parametric variations. Although this requires simplifying the problem to consider only discrete variations, useful results can still be obtained. The key advantage this approach has over other simplified methods of probabilistic analysis (e.g. controllability observability measures [Brglez et al. 1984]) is that it accurately considers the effects of correlations among stochastic values. 6. FINITE STATE SYSTEM ANALYSIS Many problems in digital system verification, protocol validation, and sequential system optimization require a detailed characterization of a finite state system over a ....
Brglez, F., Pownall, P., and Hum, P. 1984. Applications of testability analysis: From ATPG to critical path tracing. International Test Conference (Philadelphia, Oct.), IEEE, New York, pp. 705--712.
Constraint Satisfaction Using Constraint Logic Programming - Van Hentenryck, Simonis.. (1992) (22 citations) (Correct)
....as long as there is a unique path. When a d value reaches a fanout stem however, the d path can continue along any of the stems and we have to decide which one to follow. Several measures have been proposed to estimate the diculty of nding a path from some point inside the circuit to an output [4]. This value, called an observability measure, can be precomputed in a preprocessing step. For each fanout point, we obtain an ordering for the fanout stems, and try to propagate the d value along the path with highest observability rst. A similar measure estimates how dicult it is to set a ....
F. Brglez, P. Pownall, and R. Hum. Applications of Testability Analysis: From ATPG to Critical Delay Path Tracing. In Proc IEEE Int Test Conference 1984, October 1984.
New Method of Testability Calculation to Guide RT-Level Test.. - Jaan Raik Tanel (Correct)
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F. Brglez, P. Pownall, P. Hum, "Applications of Testability Analysis: From ATPG to Critical Path Tracing", Proc. Int. Test Conf., pp.705-712, 1984.
Unknown - Mcmillan Mcmillan Symbolic (Correct)
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Brglez, F., Pownall, P., and Hum, P. 1984. Applications of testability analysis: From ATPG to critical path tracing. International Test Conference (Philadelphia, Oct.), IEEE, New York, pp. 705-712.
Unknown - Mcmillan Mcmillan Symbolic (Correct)
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Brglez, F., Pownall, P., and Hum, P. 1984. Applications of testability analysis: From ATPG to critical path tracing. International Test Conference (Philadelphia, Oct.), IEEE, New York, pp. 705-712.
Symbolic Boolean Manipulation with Ordered Binary Decision Diagrams - Bryant (1992) (494 citations) (Correct)
No context found.
Brglez, F., Pownall, P., and Hum, P. 1984. Applications of testability analysis: From ATPG to critical path tracing. International Test Conference (Philadelphia, Oct.), IEEE, New York, pp. 705--712.
Symbolic Boolean Manipulation with Ordered Binary Decision Diagrams - Bryant (1992) (494 citations) (Correct)
No context found.
Brglez, F., Pownall, P., and Hum, P. 1984. Applications of testability analysis: From ATPG to critical path tracing. International Test Conference (Philadelphia, Oct.), IEEE, New York, pp. 705--712.
Symbolic Boolean Manipulation with Ordered Binary Decision Diagrams - Bryant (1992) (494 citations) (Correct)
No context found.
Brglez, F., Pownall, P., and Hum, P. 1984. Applications of testability analysis: From ATPG to critical path tracing. International Test Conference (Philadelphia, Oct.), IEEE, New York, pp. 705--712.
Symbolic Boolean Manipulation with Ordered Binary Decision Diagrams - Bryant (1992) (494 citations) (Correct)
No context found.
Brglez, F., Pownall, P., and Hum, P. 1984. Applications of testability analysis: From ATPG to critical path tracing. International Test Conference (Philadelphia, Oct.), IEEE, New York, pp. 705--712.
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