M.A. Miranda et al., "Generation of Optimized Single Distributions of Weights for Random BIST," Proc. International Test Conf. (ITC'93), pp. 1023- 1030, 1993 Home/Search Document Not in Database Summary Related Articles Check |
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Weighted Random Test Pattern Generation Using Genetic.. - Yokoyama, Takeuchi.. (Correct)
....is performed to test the remaining faults that are difficult to detect by random test patterns. In many cases, the number of random test patterns can be reduced by using a weighted random test pattern generation method in which the probabilities of 1 appearance for primary inputs are weighted [3]. Some circuits may have several distributions of optimal weights [4] The problem of finding an optimal distribution is NP hard. Therefore, some heuristics are required to solve this problem efficiently. Wunderlich had presented an efficient procedure to compute multiple distributions by ....
M.A.Miranda and C.A.L-.Barrio, "Generation of Optimized Single Distributions of Weights for Random Built-In Self Test", Proc. of ITC93, pp.1023-1050, 1993.
Improvement of the Fault Coverage of the Pseudo-Random Phase - In Column-Matching Bist (Correct)
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M.A. Miranda et al., "Generation of Optimized Single Distributions of Weights for Random BIST," Proc. International Test Conf. (ITC'93), pp. 1023- 1030, 1993
A BIST Pattern Generator Design for Near-Perfect Fault Coverage - Chatterjee, Pradhan (2003) (8 citations) (Correct)
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M.A. Miranda et al., "Generation of Optimized Single Distributions of Weights for Random BIST," Proc. Int'l Test Conf., pp. 10231030, 1993.
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