| G. C. Cross and A. K. Jain, "Markov random field texture models," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 5, pp. 25--39, 1983. |
No context found.
G. Cross and A. Jain. Markov random field texture models. IEEE Trans PAMI, 5:25--39, 1983.
No context found.
G. C. Cross and A. K. Jain, "Markov random field texture models," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 5, pp. 25--39, 1983.
No context found.
Cross, G., Jain A. " Markov Random Field Texture Models " IEEE Trans. On PAMI vol Pami-5 no 1 pp 25 - 39
No context found.
Cross, G., Jain A. " Markov Random Field Texture Models " IEEE Trans. On PAMI vol Pami-5 no 1 pp 25 - 39
No context found.
Cross G.R., Jain A. K., "Markov Random Field Texture Models" IEEE Trans on PAMI, vol. Pami-5, no. 1, pp. 25-39
No context found.
Cross G.R., Jain A. K., "Markov Random Field Texture Models" IEEE Trans. on PAMI, vol. Pami-5, no. 1, pp. 25-39, January 1983
No context found.
G. R. Cross and A. K. Jain, "Markov random field texture models," IEEE Trans. Pattern Anal. Machine Intell., vol. 5, no. 1, pp. 25-39, 1983.
No context found.
G. Cross, A.K. Jain, Markov random field texture models, IEEE Transactions on Pattern Analysis and Machine Intelligence 5 (1982) 25 -- 39.
No context found.
G. Cross and A. K. Jain. Markov random field texture models. IEEE Transactions on Pattern Analysis and Machine Intelligence, 5(1):25--39, January 1983.
No context found.
G.R. Cross and A.K. Jain. Markov random field texture models. IEEE Transactions on Pattern Analysis and Machine Intelligence, 5(1):25--39, January 1983.
No context found.
G. Cross and A. K. Jain. Markov random field texture models. IEEE Transactions on Pattern Analysis and Machine Intelligence, 5(1):25--39, Jan. 1983.
No context found.
G.R. Cross and A.K. Jain, "Markov Random Field Texture Models," IEEE Trans. Pattern Analysis and Machine Intelligence, vol. 5, pp. 25-39, 1983.
No context found.
G. R. Cross and A. K. Jain. Markov Random Field texture models. IEEE Transactions on Pattern Analysis and Machine Intelligence, 5:25--39, 1983.
No context found.
G. R. Cross and A. K. Jain. Markov Random Field texture models. IEEE Transactions on Pattern Analysis and Machine Intelligence, 5:25--39, 1983.
No context found.
Cross, G.R. and Jain, A.K.: Markov Random Field Texture Models. IEEE Trans. Pattern Anal. Mach. Intell., 18, (1983) , 25-39.
No context found.
Cross G.R., A. K. Jain, "Markov Random Field texture models" , IEEE PAMI, Vol 5, pp.25-39, 1983;
No context found.
G.R. Cross and A.K. Jain, "Markov random field texture models," IEEE Trans. on PAMI, Vol. 5, No. 1, pp 25-39, 1983.
No context found.
G. R. Cross and A. K. Jain. Markov Random Field texture models. IEEE Transactions on Pattern Analysis and Machine Intelligence, 5:25--39, 1983.
No context found.
G. Cross and A. K. Jain. Markov random field texture models. IEEE Transactions on Pattern Analysis and Machine Intelligence, 5(1):25--39, January 1983.
No context found.
G. Cross and A.K.Jain, Markov random field texture models, IEEE Trans. On PAMI., vol. 1-5, pp. 25 - 39, 1983.
No context found.
Cross GR., Jain AK. Markov random field texture models. IEEE Tr. Pattern Anal. and Mach. Intelligence 1983; 5: 25-39.
No context found.
G. R. Cross and A. K. Jain, "Markov random field texture models," IEEE Trans. on Pattern Analysis and Machine Intelligence, Vol. 5, No. 1, pp. 25-39, January 1983.
No context found.
G.R. Cross and A.K. Jain, "Markov Random Field Texture Models," IEEE Trans. Pattern Analysis and Machine Intelligence, vol. 5, pp. 25-39, 1983.
No context found.
G. R. Cross and A. K. Jain, "Markov random field texture models," IEEE Trans. Pattern Anal. Machine Intell., vol. 5, no. 1, pp. 25-39, 1983.
No context found.
G.R. Cross, A.K. Jain, "Markov Random Field Texture Models", IEEE Trans. Pattern Anal. Mach. Intell., Vol.5, No.1, pp.25-39, 1983.
First 50 documents Next 50
Online articles have much greater impact More about CiteSeer.IST Add search form to your site Submit documents Feedback
CiteSeer.IST - Copyright Penn State and NEC