R. Horst, D. Jewett, and D. Lenoski, "The risk of data corruption in microprocessor-based systems," 23rd Intl. Symp. on Fault-Tolerant Computing, Toulouse, France, June 1993, pp. 576-585. Home/Search Document Not in Database Summary Related Articles Check |
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Specialized N-Modular Redundant Processors in Large-Scale.. - Ling Yen (1996) (Correct)
....stations, defense systems, and robots in hazardous environments. For these applications, system components are exposed to exogenous sources of failures, such as electromagnetic noise, heat, vibration, voltage fluctuations, and radiation, that can induce arbitrary failures in the components [5]. When these applications are critical, i.e. when system failures can cause catastrophic loss of life and This material is based in part upon work supported by NSF under Grant No. CCR 9521419. property, it is necessary to incorporate fault tolerance techniques that can handle arbitrary ....
R. Horst, D. Jewett, and D. Lenoski, "The risk of data corruption in microprocessor-based systems," 23rd Intl. Symp. on Fault-Tolerant Computing, Toulouse, France, June 1993, pp. 576-585.
Hive: Operating System Fault Containment For Shared-Memory.. - Chapin (1997) (2 citations) (Correct)
....in a non deterministic way and hence could potentially cause a wild write. The study breaks these and other coarse categories down into a joint distribution of specific fault and error types. Finally, several studies examine the frequency of types of errors that are outside Hive s error model. [HJL93] considers the possibility of non fail fast errors in microprocessors, concluding that a data integrity violation occurs once per month in a population of 10,000 processors built with 1990 era technology. This suggests that more sophisticated data checking mechanisms may be required for very large ....
R. Horst, D. Jewett, and D. Lenoski. "The risk of data corruption in microprocessor-based systems." Twenty-Third International Symposium on Fault-Tolerant Computing, pp. 576--585 (Toulouse, France, June 22--24, 1993). Los Alamitos, CA: IEEE Computer Society Press, 1993. 132
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