| H. Bonnenberg. Secure Testing of VLSI Cryptographic Equipment. PhD thesis, ETH Zurich, 1993. |
....multiplier and adder are also used for this purpose. Concurrent controller check: Concurrent self test of the pipeline controller can efficiently be performed by merging controller and signature analyzer function into one single circuit. The entire self testing scheme is described in detail in [13]. The area requirements for off line and concurrent self test are illustrated in Table 3. Note that nearly half of the area needed for off line self test is occupied by RAM test circuitry. 3.3 Fault Localization A BIST scheme with only one signature allows detection but not localization of ....
H. Bonnenberg. Secure Testing of VLSI Cryptographic Equipment. PhD thesis, ETH Zurich, 1993.
Online articles have much greater impact More about CiteSeer.IST Add search form to your site Submit documents Feedback
CiteSeer.IST - Copyright Penn State and NEC