E. Rosenbaum, P. M. Lee, R. Moazzami, P. K. Ko and C. Hu "Circuit reliability simulator - oxide breakdown module" International Electron Devices Manufacturing Technology Digest, p. 331, 1989. Home/Search Document Not in Database Summary Related Articles |
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E. Rosenbaum, P. M. Lee, R. Moazzami, P. K. Ko and C. Hu "Circuit reliability simulator - oxide breakdown module" International Electron Devices Manufacturing Technology Digest, p. 331, 1989.
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