R. Krauthgamer, J. Lee, M. Mendel, and A. Naor. Measured Descent: A New Embedding Method for Finite Metrics. In Symposium on Foundations of Computer Science, Rome, Italy, October 2004. Home/Search Document Details and Download
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R. Krauthgamer, J. Lee, M. Mendel, and A. Naor. Measured Descent: A New Embedding Method for Finite Metrics. In Symposium on Foundations of Computer Science, Rome, Italy, October 2004.
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