M. Mishra and S.C. Goldstein. Defect tolerance at the end of the roadmap. In International Test Conference (ITC) '03, September 2003. Home/Search Document Details and Download
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The Challenges and Opportunities of Nanoelectronics - Seth Copen Goldstein Self-citation (Goldstein) (Correct)
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M. Mishra and S.C. Goldstein. Defect tolerance at the end of the roadmap. In International Test Conference (ITC) '03, September 2003.
Tools and Techniques for Evaluating Reliability Trade-ffos for.. - Bhaduri (2004) (Correct)
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M. Mishra and S. C. Goldstein, Defect tolerance at the end of the roadmap, in International Test Conference (ITC) (Charlotte, NC, Sep 30-Oct 2 2003).
Tools and Techniques for Evaluating Reliability Trade-ffos for.. - Bhaduri (2004) (Correct)
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M. Mishra and S. C. Goldstein, `Defect Tolerance at the End of the Roadmap', in Nano, quantum and molecular computing: Implications to high level design and validation (Kluwer Academic Publishers, June 2004), 73--108 To be Published.
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