Takeda, M., Inenaga, S., Bannai, H., Shinohara, A., Arikawa, S.: Discovering most classificatory patterns for very expressive pattern classes. In: 6th International Conference on Discovery Science (DS 2003). Volume 2843 of LNCS., SpringerVerlag (2003) 486--493 Home/Search Document Details and Download
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Takeda, M., Inenaga, S., Bannai, H., Shinohara, A., Arikawa, S.: Discovering most classificatory patterns for very expressive pattern classes. In: 6th International Conference on Discovery Science (DS 2003). Volume 2843 of LNCS., SpringerVerlag (2003) 486--493
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Takeda, M., Inenaga, S., Bannai, H., Shinohara, A., Arikawa, S.: Discovering most classificatory patterns for very expressive pattern classes. In: Proc. 6th International Conference on Discovery Science (DS'03). Volume 2843 of LNCS., SpringerVerlag (2003) 486--493
Finding Optimal Pairs of Patterns - Bannai, Hyyrö, Shinohara, Takeda.. (2004) Self-citation (Takeda Bannai Shinohara) (Correct)
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Takeda, M., Inenaga, S., Bannai, H., Shinohara, A., Arikawa, S.: Discovering most classificatory patterns for very expressive pattern classes. In: 6th International Conference on Discovery Science (DS 2003). Volume 2843 of LNCS., SpringerVerlag (2003) 486--493
Discovering Most Classificatory Patterns for - Takeda, Inenaga, Bannai.. (2003) Self-citation (Takeda Inenaga Bannai Shinohara Arikawa) (Correct)
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M. Takeda, S. Inenaga, H. Bannai, A. Shinohara, and S. Arikawa. Discovering most classificatory patterns for very expressive pattern classes. Technical Report DOI-TR-CS-219, Department of Informatics, Kyushu University, 2003.
Discovering Most Classificatory Patterns for Very.. - Takeda, Inenaga.. (2003) Self-citation (Takeda Inenaga Bannai Shinohara Arikawa) (Correct)
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M. Takeda, S. Inenaga, H. Bannai, A. Shinohara, and S. Arikawa. Discovering most classificatory patterns for very expressive pattern classes. Technical Report DOI-TR-CS-219, Department of Informatics, Kyushu University, 2003.
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