K.-T. Cheng and A. S. Krishnakumar, "Automatic functional test bench generation using the extended finite state machine model", in Design Automation Conference, pp. 1--6, 1993. Home/Search Document Not in Database Summary Related Articles Check |
This paper is cited in the following contexts:
Hardware-Software Covalidation: Fault Models and Test Generation - Harris (Correct)
....with the use of state machine fault models is the complexity resulting from the state space size of typical systems. Several efforts have been made to alleviate this problem by identifying a subset of the state machine which is critical for validation. The Extended Finite State Machine (EFSM) [33] and the Extracted Control Flow Machine (ECFM) 26] models create a reduced state machine by partitioning the state bits between control and data bits. In [34] a reduced state machine is generated by projecting the original state machine onto a set of states which are identified as being ....
K.-T. Cheng and A. S. Krishnakumar, "Automatic functional test bench generation using the extended finite state machine model", in Design Automation Conference, pp. 1--6, 1993.
Fault Models and Test Generation for Hardware-Software.. - Ian Harris Department (Correct)
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K.-T. Cheng and A. S. Krishnakumar, "Automatic functional test bench generation using the extended finite state machine model", in Design Automation Conference, pp. 1--6, 1993.
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