C. V. Krishna and N. A. Touba, "Reducing test data volume using LFSR reseeding with seed compression," Proc. Int. Test Conf., pp. 321--330, 2002. Home/Search Document Details and Download
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Packet-based Input Test Data Compression Techniques - Erik Volkerink Ajay (2002) (4 citations) (Correct)
....require more decompressed patterns. This will result in the same power dissipation and ATE implementation issues, described before. All proposed techniques are also applied on ISCAS 89 benchmark circuits. Table 6 describes the best compression results compared with other published techniques [27]. 7 Conclusions The problems of having a limited ATE vector memory, having long upload times, and having limited I O bandwidth, are among the most critical problems the industry is facing. This paper explored several compression techniques based on creating packets, grouping packets, and ....
C.V. Krishna and N. A. Touba, "Reducing Test Data Volume Using LFSR Reseeding with Seed Compression", To appear in Proc. of the IEEE International Test Conference (ITC), 2002.
Deterministic BIST Based on a Reconfigurable Interconnection - Lei Li And (Correct)
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C. V. Krishna and N. A. Touba, "Reducing test data volume using LFSR reseeding with seed compression," Proc. Int. Test Conf., pp. 321--330, 2002.
Low-Cost Test For Core-Based System-On-A-Chip - Gonciari (2003) (Correct)
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C. Krishna and N. A. Touba, "Reducing Test Data Volume Using LFSR Reseeding with Seed Compression," in Proceedings IEEE International Test Conference (ITC), pp. 311--320, IEEE Computer Society Press, Oct. 2002.
Deterministic BIST Based on a Reconfigurable Interconnection - Lei Li And (Correct)
No context found.
C. V. Krishna and N. A. Touba, "Reducing test data volume using LFSR reseeding with seed compression," Proc. Int. Test Conf., pp. 321--330, 2002.
Efficient Seed Utilization for Reseeding based Compression - Erik Volkerink Subhasish (2003) (2 citations) (Correct)
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C.V. Krishna and N. A. Touba, "Reducing Test Data Volume Using LFSR Reseeding with Seed Compression", Proc. of the IEEE International Test Conference (ITC), 2002.
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