Y. Tosaka, H. Kanata, T. Itakura, and S. Satoh. Simulation technologies for cosmic ray neutron-induced soft errors: Models and simulation systems. IEEE Trans. Nucl. Sci., 46(3):774--780, June 1999. Home/Search Document Not in Database Summary Related Articles Check |
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Fault Modelling and Error-Control Coding in a Network-on-Chip - Zimmer (2002) (1 citation) (Correct)
....with a nucleus in the air. If a neutron collides with a silicon (or other) nucleus, ions are generated and a certain amount of charge is generated by the reaction products. If this charge is collected its amount can pass a critical threshold and change the logic level of the corresponding node [TKIS99] As technology scales, the total amount of charge required to change a node reduces while the number of nodes per chip increases. This rapidly increases the probability of soft errors [AN00] While latches and buses have not been a concern in the past, recent research has shown that the ....
Y. Tosaka, H. Kanata, T. Itakura, and S. Satoh. Simulation technologies for cosmic ray neutron- induced soft errors: Models and simulation systems. IEEE Transactions on Nuclear Science, 46(3), June 1999.
Radiation-induced soft errors in digital circuits - A literature.. - Heijmen (2002) (Correct)
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Y. Tosaka, H. Kanata, T. Itakura, and S. Satoh. Simulation technologies for cosmic ray neutron-induced soft errors: Models and simulation systems. IEEE Trans. Nucl. Sci., 46(3):774--780, June 1999.
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