4 citations found. Retrieving documents...
Jaydeep Marathe, Frank Mueller, Tushar Mohan, Bronis R. de Supinski, Sally A. McKee, and Andy Yoo. METRIC: Tracking Down Inefficiencies in the Memory Hierarchy via Binary Rewriting. In CGO '03: Proceedings of the international symposium on Code generation and optimization, pages 289--300, Washington, DC, USA, 2003. IEEE Computer Society.

 Home/Search   Document Details and Download   Summary   Related Articles   Check  

This paper is cited in the following contexts:
Identifying and Exploiting Spatial Regularity in.. - Mohan, de.. (2003)   Self-citation (Mueller)   (Correct)

No context found.

MARATHE, J., AND MUELLER, F. Metric: Tracking down inefficiencies in the memory hierarchy via binary rewriting. In International Symposium on Code Generation and Optimization (Mar. 2003).


Identifying and Exploiting Spatial Regularity in Data.. - Mohan, de Supinski, al. (2003)   Self-citation (Mueller)   (Correct)

No context found.

MARATHE, J., AND MUELLER, F. Metric: Tracking down inefficiencies in the memory hierarchy via binary rewriting. In International Symposium on Code Generation and Optimization (Mar. 2003). accepted.


Cycle-Accurate Microarchitecture Performance Evaluation - Richard Hough Phillip (2006)   (Correct)

No context found.

Jaydeep Marathe, Frank Mueller, Tushar Mohan, Bronis R. de Supinski, Sally A. McKee, and Andy Yoo. METRIC: Tracking Down Inefficiencies in the Memory Hierarchy via Binary Rewriting. In CGO '03: Proceedings of the international symposium on Code generation and optimization, pages 289--300, Washington, DC, USA, 2003. IEEE Computer Society.


Cycle-Accurate Microarchitecture Performance Evaluation - Hough, Jones, Friedman.. (2006)   (Correct)

No context found.

Jaydeep Marathe, Frank Mueller, Tushar Mohan, Bronis R. de Supinski, Sally A. McKee, and Andy Yoo. METRIC: Tracking Down Inefficiencies in the Memory Hierarchy via Binary Rewriting. In CGO '03: Proceedings of the international symposium on Code generation and optimization, pages 289--300, Washington, DC, USA, 2003. IEEE Computer Society.

Online articles have much greater impact   More about CiteSeer.IST   Add search form to your site   Submit documents   Feedback  

CiteSeer.IST - Copyright Penn State and NEC