| Johansson E. and Hst M., "Tracking Degradation in Software Product Lines through Measurement of Design Rule Violations", In Proceedings of 14th International Conference in Software Engineering and Knowledge Engineering (SEKE), ACM, 2002. |
....be especially useful in helping to maintain a structurally sound PLA when multiple developers make parallel changes to the PLA. In such cases, a PLA s structure tends to degrade over time and gaining an insight into the quality of the overall structure becomes an increasingly difficult process [17]. Our metrics provide one particular abstraction mechanism for gaining such insight. By comparing patterns in the results for older versions of the PLA with patterns in the results for newer versions, the metrics can highlight issues such as decreasing levels of component reuse, partially) ....
Johansson, E. and M. Hst. Tracking Degradation in Software Product Lines through Measurement of Design Rule Violations. in In Proceedings of 14th International Confer- ence in Software Engineering and Knowledge Engineering (SEKE). 2002. Ischia, Italy
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Johansson E. and Hst M., "Tracking Degradation in Software Product Lines through Measurement of Design Rule Violations", In Proceedings of 14th International Conference in Software Engineering and Knowledge Engineering (SEKE), ACM, 2002.
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