Shivakumar P., M. Kistler, S. Keckler, D. Burger, and L. Alvisi, Modeling the effect of technology trends on the soft error rate of combinational logic., Proc. of International Conf. on Dependable Systems and Networks, June 2002 Pages: 389 -- 398. Home/Search Document Details and Download
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....the solution replicates data that is in active use within the cache itself while evicting those that may not be needed in the near future. Our experiments show that a large fraction of the data read from the cache have replicas available with this optimization. 1 Introduction Recent studies [9, 26, 22, 11] have shown that transient hardware errors caused by external factors such as alpha particles and cosmic ray strikes are responsible for a large percentage of system downtime. Denser processing technologies, high clock speeds and low supply voltages can worsen this problem. Consequently, ....
P. Shivakumar, M. Kistler, S. Keckler, D. Burger, and L. Alvisi. Modeling the Effect of Technology Trends on Soft Error Rate of Combinational Logic. Proceedings of the International Conference on Dependable Systems and Networks, June, 2002.
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P. Shivakumar, M. Kistler, S. Keckler, D. Burger, and L. Alvisi. Modeling the effect of technology trends on the soft error rate of combinational logic. In Proceedings of the International Conference on Dependable Systems & Networks, pages 389--398, June 2002.
Modeling the Impact of Device and Pipeline Scaling .. - Shivakumar.. (2002) Self-citation (Shivakumar Kistler Keckler Burger Alvisi) (Correct)
....from the latch. Note that the y axis of the graph is log scale. This data is also presented in Table 3. The values shown are for NMOS devices, but are essentially equivalent to PMOS devices. Note: The data presented in Figure 11 differs somewhat from that contained in our earlier conference paper [34]. This is due to a minor problem in our technique for determining which overstated values whenever was less than . Fortunately, this error has virtually no significant impact on the results shown in the rest of the paper. For a single SRAM cell, 6 77 is only slightly larger ....
P. Shivakumar, M. Kistler, S. Keckler, D. Burger, and L. Alvisi. Modeling the effect of technology trends on the soft error rate of combinational logic. In Proceedings of the International Conference on Dependable Systems & Networks, pages 389--398, June 2002.
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Shivakumar P., M. Kistler, S. Keckler, D. Burger, and L. Alvisi, Modeling the effect of technology trends on the soft error rate of combinational logic., Proc. of International Conf. on Dependable Systems and Networks, June 2002 Pages: 389 -- 398.
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Shivakumar P., et la., Modeling the effect of technology trends on the soft error rate of combinational logic., Dependable Systems and Networks, 2002.
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