| G. Balamurugan and N. R. Shanbhag, "The TwinTransistor Noise-Tolerant Dynamic Circuit Technique," IEEE Journal of Solid-State Circuits, Vol. 36, No. 2, pp. 273-280, Feb. 2001. |
.... considerations to determine bounds on the switching energy of binary transition [9] bounds on energy for deep submicron busses [15] and on biological systems [1] Second, wedev eloped key elements of a design philosophy based on noise tolerance, including noise tolerant circuit design [2], and algorithmic noise tolerance (ANT) 7] for broadband communication systems. Indeed, the recent 2001 International Technology Roadmap for Semiconductors [8] ITRS2001) has described error toleranc e as acost e#ectiv e approach for achievUfl reliability. The ITRS2001 further asserts the ....
....the EC block will be designed to be much simpler smaller than the MDSP block. Thus, the constraints on delay and power will be significantly relaxed for the EC block and therefore can be easily met with a much higher noiseimmunity. For example, one can use a highly noise tolerant circuit technique [2] to design the EC block and pay a price in terms of extra power. As the EC block is designed to be much smaller than the MDSP block, this extra power will hav e minimal impact on the ov erall power consumption. If the MDSP block is an FIR filter, then its noisy output y # (n) can be written ....
G. Balamurugan and N. R. Shanbhag. The twin-transistor noise-tolerant dynamic circuit technique. IEEE Journal of Solid-State CircrL5 , 36(2):273--280, February 2001.
No context found.
G. Balamurugan and N. R. Shanbhag, "The TwinTransistor Noise-Tolerant Dynamic Circuit Technique," IEEE Journal of Solid-State Circuits, Vol. 36, No. 2, pp. 273-280, Feb. 2001.
No context found.
G. Balamurugan and N. R. Shanbhag, "The TwinTransistor Noise-Tolerant Dynamic Circuit Technique," IEEE Journal of Solid-State Circuits, Vol. 36, No. 2, pp. 273-280, Feb. 2001.
No context found.
G. Balamurugan and N. Shanbhag, "The Twin-Transistor Noise-Tolerant Dynamic Circuit Technique," IEEE J. SolidState Circuits, vol. 36, no. 2, pp. 273-280, Feb. 2001.
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