| M Skubic and R. Volz. Identifying single-ended contact formations from force sensor patterns. IEEE Transactions of Rob. and Aut., 16(5):597--603, October 2000. |
....and methods based on analytical contact models. The learned models can handle uncertainty taken into account at modeling time: learned models can handle deviations around nominal parameter values for which learning data was available at training time. A deterministic, Bayesian, Fuzzy [19] or Neural Network model [1] performs the CF recognition or transition detection. Hidden Markov Models [12, 10] are a popular tool for both the detection of transitions and the recognition of the current cf. Simultaneous CF recognition and geometrical parameter estimation. The di#erent CF models ....
M Skubic and R. Volz. Identifying single-ended contact formations from force sensor patterns. IEEE Transactions of Rob. and Aut., 16(5):597--603, October 2000.
....type of uncertainty. Based on position, velocity and or force measurements, different research groups use different sensor processing techniques to deal with these uncertainties: e.g. 1] presents a stochastic filter based on a trained Hidden Markov Model to recognize contact transitions; [2] recognizes CFs with a trained fuzzy or neural network classifier; 3, 4] recognize CFs with deterministic classifiers based on polyhedral convex cones; 5, 6] describe a stochastic estimator which estimates the inaccurately known geometrical parameters of the contacting objects; etc. The ....
Marjorie Skubic and Richard A. Volz, "Identifying single-ended contact formations from force sensor patterns," IEEE Transactions on Automatic Control, vol. 16, no. 5, pp. 597--603, October 2000.
No context found.
M Skubic and R. Volz. Identifying single-ended contact formations from force sensor patterns. IEEE Transactions of Rob. and Aut., 16(5):597--603, October 2000.
No context found.
M Skubic and R. Volz, "Identifying single-ended contact formations from force sensor patterns," IEEE Transactions of Rob. and Aut., vol. 16, no. 5, pp. 597--603, October 2000.
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