D. Marculescu, R. Marculescu, and M. Pedram, `Trace-Driven Steady-State Probability Estimation with Application to Power Estimation,' in Proc. Design Automation and Test in Europe Conf., Feb. 1998. Home/Search Document Details and Download
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Methodolgies for Predictability Optimization - Srivastava (2002) (Correct)
....sequential power estimation is imperative. 42] is among the earlier works that tries to address the power estimation problem in sequential circuits. They try to capture the temporal correlation by looking at the next stage logic. Switching activity estimation in FSMs was further addressed in [56], 10] Among prediction works that have a direct correspondence with this thesis is [41] In this work, the authors propose a parameterizable model for RT Level soft macros which are flexible with the chosen synthesis option, input statistics and word length. This flexibility could be used to ....
D. Marculescu, R. Marculescu, and M. Pedram. "Trace-Driven Steady-State Probability Estimation in FSMs with Application to Power Estimation". In Proc. Design Automation and Test in Europe Conf, Feb 1998. 101
Theoretical Bounds for Switching Activity Analysis in .. - Marculescu.. (1998) (2 citations) Self-citation (Marculescu Pedram) (Correct)
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D. Marculescu, R. Marculescu, and M. Pedram, `Trace-Driven Steady-State Probability Estimation with Application to Power Estimation,' in Proc. Design Automation and Test in Europe Conf., Feb. 1998.
Implicit Resolution of the Chapman-Kolmogorov Equations for.. - Freitas, Oliveira (2003) (Correct)
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D. Marculescu, R. Marculescu, and M. Pedram. Trace-driven steady-state probability estimation in fsms with application to power estimation. In Proceedings of the Design, Automation and Test in Europe, pages 774--781, Paris, 1998.
Implicit Resolution of the Chapman-Kolmogorov Equations for.. - Freitas, Oliveira (2003) (Correct)
No context found.
D. Marculescu, R. Marculescu, and M. Pedram. Trace-driven steady-state probability estimation in fsms with application to power estimation. In Proceedings of the Design, Automation and Test in Europe, pages 774--781, Paris, 1998.
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