| F. Shull, V.R. Basili, B. Boehm, A. W. Brown , P. Costa, M. Lindvall, D. Port, I. Rus, R. Tesoriero, and M. V. Zelkowitz, "What We Have Learned About Fighting Defects", in Proceedings of 8th International Software Metrics Symposium , 2002, pp. 249-258. Available: http://fcmd. umd.edu/fcmd/Papers/shull_defects.ps |
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F. Shull, V.R. Basili, B. Boehm, A. W. Brown , P. Costa, M. Lindvall, D. Port, I. Rus, R. Tesoriero, and M. V. Zelkowitz, "What We Have Learned About Fighting Defects", in Proceedings of 8th International Software Metrics Symposium , 2002, pp. 249-258. Available: http://fcmd. umd.edu/fcmd/Papers/shull_defects.ps
....this supports is that attempts to target the high defect class of modules can have a very worthwhile payoff. Full results of the eWorkshops, including the summarized expert discussion, are available online at http: www.cebase.org www researchActivities defectRed uction index.htm as well as in [6]. The process has since been applied to other areas, such as COTS based development and agile development methods , see [7] http: www.cebase.org www researchActivities COTS index.html ....
Shull, F., Basili, V. R., Zelkowitz, M. V., Boehm, B., Brown, A. W., Costa, P., Lindvall, M., Port, D., Rus, I., and Tesoriero, R. What We Have Learned About Fighting Defects. International Software Metrics Symposium, Ottawa Canada. 2002.
....has been the running of eWorkshops (or on line meetings) that capture expert knowledge to formulate heuristics on a particular software engineering topic. The CeBASE project defined the eWorkshop and has used the technology to collect valuable empirical evidence on defect reduction and COTS. [9] The rise of Agile Methods provides a fruitful area for such empirical research. This paper discusses the results of the first eWorkshop on Agile Methods sponsored by the Fraunhofer Center Maryland and North Carolina State University using the CeBASE eWorkshop technology. The discussion items are ....
Shull, F., et al. What We Have Learned about Fighting Defects. in International Software Metrics Symposium. 2002. Ottawa, Canada.
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