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A. W. Williams and R. L. Probert. A practical strategy for testing pair-wise coverage of network interfaces. Seventh Intl. Symp. on Software Reliability Engineering, pages 246--254, 1996.

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A Test Generation Strategy for Pairwise Testing - Lei, Tai (2001)   (7 citations)  (Correct)

....method of orthogonal arrays requires that all parameters have the same number of values and that each pair of values be covered the same number of times [ 8 ] The first requirement can be relaxed by adding don t care values for missing values. But the use of don t care values creates extra tests [ 9 ] . The second requirement is considered unnecessary for software testing and also creates extra tests for pairwise testing [ 1 ] In this paper, we propose a new test generation strategy, called in parameter order (or IPO) for pairwise testing. For a system with two or more input parameters, ....

A. W. Williams and R. L. Probert. A practical strategy for testing pair-wise coverage of network interfaces. Proc. IEEE Int. Symp. Software Reliability Engineering, pages 246--254, 1996. 14


Combinatorial Designs In Multiple Faults Localization For.. - Fecko, Steinder (2001)   (Correct)

....= 16 nodes yielding up to 3 120 = 1.8e57 configurations. To cope with the above problem, we will adopt the combinatorial design paradigm [4, 6, 10, 16] which has been successfully used in applications ranging from medicine and biology, to quality engineering [18] to testing network interfaces [24, 23] and software intensive systems [3, 4, 5] 4.1 Statistical Paradigm Suppose that a system is described by parameters p 1 , p k , where each p i assumes q i values p i,1 , p i,q i . In the statistical terminology, we say that each factor p i has a level of q i [6, 10] The number ....

....(all levels are q i = q = 3) Since our event correlation technique makes its decisions based on statistical analysis of the entire set of configurations, orthogonal arrays are the preferred one of the two types of designs. In the applications of the paradigm reported in the computing literature [3, 5, 23], the values of m 4 are rarely used. Typically, pairwise (m = 2) or triple (m = 3) interaction coverage is considered sufficient. Empirical studies show that very few additional system faults can be revealed by increasing m beyond three, at the expense of the undesirable increase of the number ....

A. L. Williams and R. L. Probert. A practical strategy for testing pairwise coverage at network interfaces. In Proc. IEEE ISSRE: Int'l Symp. Softw. Reliability Eng., White Plains, NY, 1996.


A Framework of Greedy Methods for Constructing.. - Bryce, Colbourn, Cohen   (Correct)

No context found.

A. W. Williams and R. L. Probert. A practical strategy for testing pair-wise coverage of network interfaces. Seventh Intl. Symp. on Software Reliability Engineering, pages 246--254, 1996.


A Deterministic Density Algorithm for Pairwise Interaction.. - Colbourn, Cohen, al. (2004)   (3 citations)  (Correct)

No context found.

A. W. Williams and R. L. Probert. A practical strategy for testing pair-wise coverage of network interfaces. In Proc. Seventh Intl. Symp. on Software Reliability Engineering, 1996, pp. 246-54.


A Framework of Greedy Methods for Constructing.. - Bryce, Colbourn, Cohen (2005)   (Correct)

No context found.

A. W. Williams and R. L. Probert. A practical strategy for testing pair-wise coverage of network interfaces. Seventh Intl. Symp. on Software Reliability Engineering, pages 246--254, 1996.


A Deterministic Density Algorithm for Pairwise Interaction.. - Colbourn, Cohen, al. (2004)   (3 citations)  (Correct)

No context found.

A. W. Williams and R. L. Probert. A practical strategy for testing pair-wise coverage of network interfaces. In Proc. Seventh Intl. Symp. on Software Reliability Engineering, 1996, pp. 246-54.


A Framework of Greedy Methods for Constructing.. - Bryce, Colbourn, Cohen (2005)   (Correct)

No context found.

A. W. Williams and R. L. Probert. A practical strategy for testing pair-wise coverage of network interfaces. Seventh Intl. Symp. on Software Reliability Engineering, pages 246--254, 1996.

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