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Jim Gray. A census of Tandem system availability between 1985 and 1990. IEEE Transactions on Reliability, 39(4), October 1990.

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Detection and Recovery Techniques for Database Corruption - Bohannon, Rastogi..   (Correct)

....Sizes . 30 3 Cost of Corruption Protection . 31 1 Introduction As hardware gets more reliable, software errors are often the greatest threat to database system availability [Sul93, Gra90] even in standard database systems where database data is protected by process boundaries from errors in application programs. Increasingly, however, for extensibility and performance, special purpose application code is being integrated with database system code. Extensible databases allow ....

J. Gray. A census of Tandem system availability between 1985 and 1990. IEEE Trans. on System Reliability, 39(4):409--418, October 1990.


File Systems with Multiple File Implementations - Stata (1992)   (1 citation)  (Correct)

....is stored in order to increase potential parallelism also increases the probability that the file will fail. The more devices a file is striped across, the higher the probability that one of them will fail [Schulze89] Although the failure rates of secondary storage are decreasing dramatically [Gray90], relying on the reliability of individual devices is not a cost effective solution to the fault tolerance problem of disk arrays; rather, redundancy is needed [Patterson88] 7 1.1.4 The increasing demand for capacity The final trend we will consider is the growing size of file servers. If past ....

Jim Gray. A census of Tandem system availability between 1985 and 1990. Technical Report 90.1. Tandem Computers Incorporated, September 1990.


Future Directions in the Evolution of the L4 Microkernel - Elphinstone   (Correct)

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Jim Gray. A census of Tandem system availability between 1985 and 1990. IEEE Transactions on Reliability, 39(4), October 1990.


Future Directions in the Evolution of the L4 Microkernel - Elphinstone   (Correct)

No context found.

Jim Gray. A census of Tandem system availability between 1985 and 1990. IEEE Transactions on Reliability, 39(4), October 1990.

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