| Ebert, C. "Metrics for Identifying Critical Components in Software Projects," Handbook of Software Engineering and Knowledge Engineering. 2001. |
.... contributed to user failures; Stan Rifkin recalled data from Nortel switches showing that 80 of the defects came from 20 of the most changed modules; Christof Ebert said that data from Alcatel confirmed that 20 of modules contain about 40 to 80 of defects, depending on product line [8]; Otto Vinter had data that 70 of defects come from 19 of modules. Gary Thomas and Dan Roy (based on work on Landsat D) also believed the heuristic to be true, although they had no hard data. However it was recognized that the 80 20 heuristic is not a hard and fast rule but varies based on ....
Ebert, C. "Metrics for Identifying Critical Components in Software Projects," Handbook of Software Engineering and Knowledge Engineering. 2001.
.... contributed to user failures; Stan Rifkin recalled data from Nortel switches showing that 80 of the defects came from 20 of the most changed modules; Christof Ebert said that data from Alcatel confirmed that 20 of modules contain about 40 to 80 of defects, depending on product line [8]; Otto Vinter had data that 70 of defects come from 19 of modules. Gary Thomas and Dan Roy (based on work on Landsat D) also believed the heuristic to be true, although they had no hard data. However it was recognized that the 80 20 heuristic is not a hard and fast rule but varies based on ....
Ebert, C. "Metrics for Identifying Critical Components in Software Projects," Handbook of Software Engineering and Knowledge Engineering. 2001.
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