| Chapman, R. Industrial Experience with SPARK. Proceedings of ACM SIGAda Annual International Conference (SIGAda 2000), November 12--16, 2000, Johns Hopkins University /Applied Physics Laboratory, Laurel, MD, USA. |
.... [18] 23] 24] 53] The successful practical application of MC DC for satellite control software has been evaluated [19] though the difficulties during the analysis of this type of coverage (e.g. it is extremely expensive to carry out and can affect staff morale and time) were also addressed [12]. The application of this criterion in the testing of digital circuits was considered in [34] test suite reduction and prioritization algorithms for MC DC in [30] A number of software tools (CodeTEST [3] DACS Object Coverage Tools [17] LDRA Testbed [33] etc. support the MD DC criterion. ....
Chapman, R. Industrial Experience with SPARK. Proceedings of ACM SIGAda Annual International Conference (SIGAda 2000.
....coverage modified condition decision coverage multiple condition coverage # # # # # # # # ## # # # # # ## # # # # # ## # # # # # ## Fig. 1. The hierarchy of control flow criteria. of coverage (e.g. it is extremely expensive to carry out and can affect staff morale and time) were also addressed [3]. The application of this criterion in the testing of digital circuits was considered in [12] A number of software tools (LDRA Testbed, McCabe, ATTOL, CodeTEST, Cantata , etc. support the MD DC criterion. However, it should be noted that the original definition of the MC DC criterion allows ....
Chapman, R. Industrial Experience with SPARK. Proceedings of ACM SIGAda Annual International Conference (SIGAda
No context found.
Chapman, R. Industrial Experience with SPARK. Proceedings of ACM SIGAda Annual International Conference (SIGAda 2000), November 12--16, 2000, Johns Hopkins University /Applied Physics Laboratory, Laurel, MD, USA.
No context found.
Roderick Chapman. Industrial experience with SPARK. Presented at SIGAda'00, November 2000. Available from http://www.praxis-cs.co.uk.
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