Lindner, R. J., and Tudahl, D. "Software Development at a Baldrige Winner," Proceedings of ELECTRO'94, Boston, MA, May 12, 1994, pp. 167-180. Home/Search Document Not in Database Summary Related Articles Check |
This paper is cited in the following contexts:
What We Have Learned About Fighting Defects - Shull, Basili, Boehm, Brown.. (2002) (Correct)
....and fixing a software problem after delivery is often 100 times more expensive than finding and fixing it during the requirements and design phase. Discussion: General data were presented that supported an effort increase of approximately 100:1. Don O Neill described data from IBM Rochester [10] in the pre meeting feedback that found an increase in effort of about 13:1 for defect slippage from code to test and a further 9:1 increase for slippage from test to field (so, a ratio of about 117:1 from code to field) From Yoshihiro Matsumoto s experience in a software factory of 2600 IT ....
....found during reviews with the number found during testing activities) The majority of participants felt that, using this definition, a valid heuristic is that reviews find 60 90 of defects. The 90 value as a fuzzy upper bound was supported by publications by Capers Jones, Richard Lindner [10], Tim Olson [12] and also from the data submitted by Brown, Laitenberger, and O Neill (for disciplined teams) As Philip Johnson pointed out, this definition is only meaningful in an environment where there is a clear boundary between development and release. Several participants felt that this ....
Lindner, R. J., and Tudahl, D. "Software Development at a Baldrige Winner," Proceedings of ELECTRO'94, Boston, MA, May 12, 1994, pp. 167-180.
What We Have Learned About Fighting Defects - Shull, Basili, Boehm, Brown.. (2002) (Correct)
....and fixing a software problem after delivery is often 100 times more expensive than finding and fixing it during the requirements and design phase. Discussion: General data were presented that supported an effort increase of approximately 100:1. Don O Neill described data from IBM Rochester [10] in the pre meeting feedback that found an increase in effort of about 13:1 for defect slippage from code to test and a further 9:1 increase for slippage from test to field (so, a ratio of about 117:1 from code to field) From Yoshihiro Matsumoto s experience in a software factory of 2600 IT ....
....found during reviews with the number found during testing activities) The majority of participants felt that, using this definition, a valid heuristic is that reviews find 60 90 of defects. The 90 value as a fuzzy upper bound was supported by publications by Capers Jones, Richard Lindner [10], Tim Olson [12] and also from the data submitted by Brown, Laitenberger, and O Neill (for disciplined teams) As Philip Johnson pointed out, this definition is only meaningful in an environment where there is a clear boundary between development and release. Several participants felt that this ....
Lindner, R. J., and Tudahl, D. "Software Development at a Baldrige Winner," Proceedings of ELECTRO'94, Boston, MA, May 12, 1994, pp. 167-180.
Building an Experience Base for Software.. - Basili.. (2001) (2 citations) (Correct)
....programming (XP) remove any kind of meaningful distinction between early and late development phases, and research has not targeted such environments yet. General data were presented that supported an effort increase of approximately 100:1. Don O Neill described data from IBM Rochester [6] in the pre meeting feedback that reported an increase in effort of about 13:1 for defect slippage from code to test and a further 9:1 increase for slippage from test to field (so, a ratio of about 117:1 from code to field) Based on Yoshihiro Matsumoto s background in a software factory of 2600 ....
Lindner, Richard J. & Tudahl, D. "Software Development at a Baldrige Winner," Proceedings of ELECTRO 94, Boston, Massachusetts, May 12, 1994, pp. 167-180.
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