S. Arvindam, V. Kumar, V. N. Rao, and V. Singh. Automatic test pattern generator on parallel processors. Technical Report TR 90-20, University of Minnesota, 1990. Let ~ O (\Delta) denote the following shorthand for asymptotic behavior with high probability [20]: A random variable X is in ~ O (g(P )) iff 8fi ? 0 : 9c ? 0 : 9P0 : 8P P0 : P [X cf(P )] 1 \Gamma P 10 Home/Search Document Not in Database Summary Related Articles Check |
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Asynchronous Random Polling Dynamic Load Balancing - Sanders (Correct)
....takes place in rounds. This model is compatible with the LogP model. 1 Introduction Many algorithms in operations research and artificial intelligence are based on the backtracking principle for traversing large irregularly shaped trees that are only defined implicitly by the computation [3, 4, 6, 9, 12 14, 19, 17, 21, 35]. Similar problems also play a role in parallel programming languages [1, 16] Even for loop scheduling and some numerical problems [7, 24] like adaptive numerical integration [25] it can be useful to view the computations as an implicitly defined tree (refer to [34] for a more detailed discussion ....
S. Arvindam, V. Kumar, V. N. Rao, and V. Singh. Automatic test pattern generator on parallel processors. Technical Report TR 90-20, University of Minnesota, 1990. Let ~ O (\Delta) denote the following shorthand for asymptotic behavior with high probability [20]: A random variable X is in ~ O (g(P )) iff 8fi ? 0 : 9c ? 0 : 9P0 : 8P P0 : P [X cf(P )] 1 \Gamma P 10
Tree Shaped Computations as a Model for Parallel Applications - Sanders (1998) (Correct)
....for example observed if the individual iterations are in fact tree search problem. For example, in airline crew pairing generation [GHL97] a heuristic enumeration of round trips for anonymous crew members is done. Each loop iteration is a backtrack search starting with a particular connection. In [AKRS90] each loop iterations represents a possible fault in a VLSI circuit and a backtracking search is used to find a test pattern covering this fault. This application is so irregular that random polling is used to parallelize both the outer loop and the backtrack search. Many numerical and ....
S. Arvindam, V. Kumar, V. N. Rao, and V. Singh. Automatic test pattern generator on parallel processors. Technical Report TR 90-20, University of Minnesota, 1990.
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