D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: An approach to testing based on combinatorial design. IEEE Trans. Softw. Eng., 23(7):437--444, July 1997.  Home/Search   Document Details and Download   Summary   Related Articles   Check

....testing criterion, which requires that for each pair of input parameters of a system, every combination of valid values of these two parameters be covered by at least one test case. Empirical results show that pairwise testing is practical and effective for various types of software systems [ 1 ] [ 2 ] [ 3 ] 5 ] 6 ] To illustrate the concept of pairwise testing, consider a system with parameters and values as shown below: ffl parameter A has values A 1 and A 2 , ffl parameter B has values B 1 and B 2 , and ffl parameter C has values C 1 , C 2 and C 3 . For parameters A and B, f(A 1 ; ....

....without reusing the existing test set. The other is to modify the existing test set and then generate additional tests, if necessary, such that the combined test set is a pairwise test set. Another test generation tool for pairwise testing is AETG (Automatic Efficient Test Generator) 1 ] [ 2 ] . We used AETG to produce pairwise test sets for the six systems mentioned in [ 2 ] We also used PairTest to generate pairwise test sets for the same six systems. Table 1 shows the size information produced by AETG and PairTest for these six systems. As shown in Table 1, each of AETG and ....

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D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: An approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--443, July 1997.

....that has been relatively untouched by testing so far. The second approach may be implemented in the form of antirandom testing [yin97] A combinatorial design based test generation can significantly reduce the number of combinations to be considered. This is the approach used in AETG (Bellcore) [coh97] It is also possible to generate tests using the software implementation formation. Some tools can use this approach termed white box testing. Such test generation can require enormous amounts of computation, and thus should be considered only for branches, p uses, etc. which are very hard to ....

D.M. Cohen, S.R. Dalal, M.L. Fredman and G.C. Patten, "The AETG System: An Approach to Testing based on Combinatorial Design", IEEE Trans. Software Engineering, July 1997, pp. 437-444.

....guarantees that each activity in the plan will be executed within the temporal constraints specified in the plan. The temporal constraints are needed to s3mchronize the start and end times of activities on parallel timelines. For example, consider activities A and B with a start time window of [5,10] and a temporal constraint that B must start two seconds after A. If A starts at time 6, then B nmst start at time 8, even though the start window for B is [5,10] It is insufficient to guarantee only that A and B start within their time windows. See Figure t. within 6 Starts 2s fore B 8 ....

....the start and end times of activities on parallel timelines. For example, consider activities A and B with a start time window of [5,10] and a temporal constraint that B must start two seconds after A. If A starts at time 6, then B nmst start at time 8, even though the start window for B is [5,10]. It is insufficient to guarantee only that A and B start within their time windows. See Figure t. within 6 Starts 2s fore B 8 Figure 1: Temporal Relations During execution, MIR observes the cramhands and the state of the spacecraft. If the com2nanded state differs from the observed state, ....

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D. M. Cohen, S. R. Dalai, M. L. Friechnan, and G. C. Patton, "The AETG System: An Approach to Testing Based on Combinatorial Design", IEEE Transactions on Software Engineering, Vol., 23 No. 7, pp. 437-444, July 1997.

....were no larger than 50. And often some of the parameters were Boolean ones, so some of the n i were only 2. Q: Were you able to make good progress A: We did but can t claim much credit. When we began looking at these matters we were told that [8] had the essential information. That paper cites [3, 4] where related ideas are used. We looked at the methods proposed in these papers and felt that certain combinatorial ideas could be pro tably applied, giving test suites that have few tests and are easy to nd. We developed three such ideas, which we call the ane, recursive, and Boolean ....

....it, and I hope that the record of our discussion may bene t others as well. It is useful to have in one place all those seemingly unrelated facts scattered in the literature as well as your own insight. A: All right. Let s begin by looking at the methods proposed in the papers we rst looked at, [3, 4, 8]. 2 Incremental Constructions Q: Before that, just to make sure I understand the problem, let me check that some things that look obvious to me are really correct. If you increase the number of parameters (leaving the n i for the old parameters unchanged) or if you increase some n i s then ....

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David M. Cohen, Siddharta R. Dalal, Michael L. Fredman, Gardner C. Patton, \The AETG system: An approach to testing based on combinatorial design," IEEE Trans. on Software Engineering 23 (1997) 437-444.

....configurations. To cope with the above problem, we will adopt the combinatorial design paradigm [4, 6, 10, 16] which has been successfully used in applications ranging from medicine and biology, to quality engineering [18] to testing network interfaces [24, 23] and software intensive systems [3, 4, 5]. 4.1 Statistical Paradigm Suppose that a system is described by parameters p 1 , p k , where each p i assumes q i values p i,1 , p i,q i . In the statistical terminology, we say that each factor p i has a level of q i [6, 10] The number of configurations is therefore equal ....

....for k = 10, where each p i assumes binary values of 0 and 1, there are 10 possible configurations. However, all 2 way interactions can optimally be covered by only six configurations of (0000000000) 0000111111) 0111000111) 1011011001) 1101101010) and (1110110100) 6] It can be shown [3] that, for fixed m, the number of configurations in factor covering designs grows logarithmically in the number of factors k. If a design satisfies an additional requirement that each m way interaction p i 1 ,l 1 , p i m ,l m appears the same number of times in the generated set of ....

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D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: An approach to testing based on combinatorial design. IEEE Trans. Softw. Eng., 23(7), 1997.

....in characterization Beyond simply measuring failure rates, Ballista testing has the potential to characterize failure patterns through the use of patterned testing on fme grain dial based representations of data values. Previous work in the area of test exploration includes the AETG system [9], which permits testers to specify which sets of parameters in a multi parameter function calls are closely coupled functionally, and thus should be tested in concert. The TOFU system [6] takes this a step further by adding interaction weightings to the identified parameter tuples. Clearly the ....

Cohen, D., Dalal, S., Fredman, M. & Patton, G. "The AETG System: an approach to testing based on combinatorial design," IEEE Transactions on Software Engineering, 23(7): 437-44, Jul. 1997.

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D.M.Cohen,S.R.Dalal,M.L.Fredman,andG.C. Patton. The AETG system: an approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--44, October 1997.

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D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: an approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--44, 1997.

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D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: an approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--44, October 1997.

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D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: an approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--44, 1997.

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D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: an approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--44, October 1997.

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D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: An approach to testing based on combinatorial design. IEEE Trans. Softw. Eng., 23(7):437--444, July 1997.

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David M. Cohen, Siddhartha R. Dalal, Michael L. Fredman, and Gardner C. Patton. The AETG system: An approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--444, 1997.

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D.M.Cohen,S.R.Dalal,M.L.Fredman,andG.C. Patton. The AETG system: an approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--44, October 1997.

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D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: an approach to testing based on combinatorial design. IEEE Trans. Software Engineering, 23(7):437--444, 1997.

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D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The aetg system: an approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--44, October 1997.

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D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: an approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--44, October 1997.

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D.M. Cohen, S. R. Dalal, M. L. Fredman, G.C. Patton, "The AETG System: An Approach to Testing Based on Combinatorial Design", IEEE Trans. on Soft. Eng. , vol. 23, 437--443, 1997.

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D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: an approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--44, October 1997.

No context found.

D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The aetg system: an approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--44, October 1997.

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D. M. Cohen, S. R. Dalal, M. L. Fredman and G. C. Patton, The AETG system: an approach to testing based on combinatorial design, IEEE Transactions on Software Engineering, 23(7) (2000), 437--444.

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D. M. Cohen, S. R. Dalal, M. L. Fredman and G. C. Patton, The AETG system: an approach to testing based on combinatorial design, IEEE Transactions on Software Engineering, 23(7) (1997), 437-444.

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D.M. Cohen, S.R. Dalal, M.L. Fredman, and G.C. Patton,The AETG System: An Approach to Testing Based on Combinatorial Design, IEEE Transactions On Software Engineering, 1997. 23, 437-444.

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Cohen D.M., D.S.R., Fredman M. L., Patton G.C., The AETG System: An Approach to Testing Based on Combinatorial Design. IEEE Transactions On Software Engineering, 1997. 23, 437-444.

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D. Cohen, S. Dalal, M. Fredman, and G. Patton. The AETG system: An approach to testing based on combinatorial design. IEEE Trans. Softw. Eng., 23(7), July 1997.

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