B. Boppana, R. Mukherjee, J. Jain, and M. Fujita, Multiple Error Diagnosis Based On Xlists, Proc. of Design Automation Conf., pp. 100-110, (June 1999).  Home/Search   Document Not in Database   Summary   Related Articles   Check

....silicon debugging process. After years of research, fault diagnosis has become more mature and practical for combinational circuits (i.e. designs with full scan support) There are two major types of approaches [1] 1) cause effect analysis [13] and (2) effectcause analysis [6] 10] 12] 7] 14][3]. In general, the causeeffect analysis that uses a pre calculated fault dictionary is more efficient in term of the diagnosis time, but less capable of dealing with non stuck at type of faults. On the other hand, the effect cause analysis is able to deal with any type of logic faults, only at the ....

B. Boppana, R. Mukherjee, J. Jain, and M. Fujita, "Multiple Error Diagnosis Based On Xlists,"Proc. of Design Automation Conf., pp. 100-110, (June 1999).

....diagnose single errors in combinational circuits. The 5 e#ectiveness of the model was studied by injecting random gate substitution errors into ISCAS 85 combinational benchmark circuits. The model has been extended to multiple errors, and utilizes the locality of errors (region based error model) [19]. The results of diagnosis of single gate substitution errors are presented in Table 1.1. The columns represent, for each of the circuits, an average rank of the stuck at 0 fault at the erroneous node, an average rank of stuck at 1 fault at the erroneous node, an average rank produced by the ....

....circuit in full scan mode. Our experiments performed on the ISCAS 89 benchmark circuits by introduction of single and multiple stuck faults and multiple gate substitution errors show that the diagnosis algorithm is indeed e#ective in diagnosing the errors. 1. 1 Region Based Model Bopanna et al. [19] have proposed two logic level, structural, error models to capture the locality of errors for application in diagnosis: the topologically bounded error model and the region based error model. In our work, we use the region based error model for capturing the e#ects of errors in the vicinity of ....

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V. Boppana, R. Mukherjee, J. Jain and M. Fujita, "Multiple Error Diagnosis Based on Xlists", in Proc. Design Automation Conf., 1999, pp. 100--110.

....accordingly. A general model for both fault and error diagnosis was proposed by Boppana et al. 17] and has been used to e ectively diagnose single errors in combinational circuits. The model was then extended to locate multiple errors and used the concept of locality (Region based error model) [18,19]. This work was furthered by D Souza et al. 20] to tackle diagnosis of sequential circuits. In this work, we present three algorithms to perform enhanced error diagnosis by eliminating as many false candidates as possible from an initial list of candidate error regions obtained from the original ....

....PIs POs IMPLEMENTATION PIs POs A X X X X X 1 0 IMPLEMENTATION PIs POs IMPLEMENTATION PIs POs X X B 0 1 Figure 1: Region Based Diagnosis: Region A candidate region; Region B not a candidate region. 2 Preliminaries The region based model was introduced by Bopanna et al. in [18]. Typically a region consists of a node or a gate in the circuit and its surrounding gates. The radius of a region speci es the actual size of the region. A region of radius 0 consists of just one single node in the circuit. A region of radius 1 consists of a center node, its immediate ....

V. Boppana, R. Mukherjee, J. Jain and M. Fujita, \Multiple error diagnosis based on xlists", in Proc. Design Automation Conf., 1999, pp. 100-110.

....to diagnose single errors in combinational circuits. The e#ectiveness of the model was studied by injecting random gate substitution errors in ISCAS 85 combinational benchmark circuits. The model has been extended to multiple errors which utilizes the locality of errors (Region based error model) [2, 4]. In this work, we have used the region based model for diagnosing gate connection errors in combinational circuits. We have also used the region based model to diagnose errors in sequential circuits by isolating the time # This research was supported in part by the NJ Commission on Science and ....

....to carry on a diagnosis of the sequential circuit in full scan mode. Our experiments performed on the ISCAS 89 benchmark circuits by introduction of single and multiple stuck faults show that the diagnosis algorithm is indeed e#ective in diagnosing the errors. 2 Region Based Model Boppana et al. [2] have proposed two logic level, structural, error models to capture the locality of errors for application in diagnosis: topologically bounded error model and the region based error model. We use the regionbased error model for capturing the e#ects of errors in the vicinity of any gate in the ....

[Article contains additional citation context not shown here]

V. Boppana, R. Mukherjee, J. Jain and M. Fujita, "Multiple error diagnosis based on xlists", in Proc. Design Automation Conf., 1999, pp. 100--110.

....A defect in a vicinity region in a structural netlist of a circuit can cause the nodes of that region to assume some arbitrary values that may be different from the good circuit value of those nodes. We model such regional defects by first using the region based error model (a logic level model) [14], in which all the nodes in a region (representing the vicinity region of interest) are initially set to unknown values during simulation. In doing so, propagation behavior of arbitrary defects can be examined. Taking this approach a step further, we can compute the excitation and propagation ....

....presented on the ISCAS 85 benchmark circuits. 8 Chapter 2 Modeling Arbitrary Defects Two gate level error models that capture the locality of errors have been proposed in the past to address the application of diagnosis: the topologically bounded error model and the region based error model [14]. In this work, we use the region based error model for capturing arbitrary defects in the vicinity of any node in the circuit. A group of nodes belonging to a region is allowed to carry a defect on any node within the group. Such groups are called region based X lists. These X lists form the ....

V. Boppana, R. Mukherjee, J. Jain, P. Bollineni and M. Fujita, "Multiple Error Diagnosis based on Xlists", to apprear in Proc. Design Automation Conference, 1999.

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B. Boppana, R. Mukherjee, J. Jain, and M. Fujita, Multiple Error Diagnosis Based On Xlists, Proc. of Design Automation Conf., pp. 100-110, (June 1999).

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B. Boppana, R. Mukherjee, J. Jain, and M. Fujita, "Multiple Error Diagnosis Based On Xlists," Proc. of Design Automation Conf., pp. 100-110, (June 1999).

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