| J. Theiler, D. Lavenier, N. Harvey, S. Perkins, and J. Szymanski, "Using blocks of skewers for faster computation of pixel purity index," in Proc. of the SPIE International Conference on Optical Science and Technology, 2000. |
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J. Theiler, D. D. Lavenier, N. R. Harvey, S. J. Perkins, and J. J. Szymanski, "Using blocks of skewers for faster computation of pixel purity," Proc. SPIE 4132, pp. 61--71, 2000.
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J. Theiler, D. Lavenier, N. Harvey, S. Perkins, J. Szymanski, "Using blocks of skewers for faster computation of pixel purity index," SPIE International Conference on Optical Science and Technology, San Diego, CA, USA, 2000.
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Theiler, J., D.D. Lavenier, N.R. Harvey, S.J. Perkins, and J.J. Szymanski, "Using blocks of skewers for faster computation of pixel purity index," to appear in proceedings of SPIE 4132 (2000).
No context found.
J. Theiler, D. Lavenier, N. Harvey, S. Perkins, and J. Szymanski, "Using blocks of skewers for faster computation of pixel purity index," in Proc. of the SPIE International Conference on Optical Science and Technology, 2000.
No context found.
J. Theiler, D. Lavenier, N. Harvey, S. Perkins, and J. Szymanski, "Using blocks of skewers for faster computation of pixel purity index," in Proc. of the SPIE International Conference on Optical Science and Technology, 2000.
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